Using Synchrotron Infrared Spectroscopy and X-ray Fluorescence Microscopy to Explore Fingermark Chemistry
Access Status
Open access
Date
2022Supervisor
Simon Lewis
Mark Hackett
Type
Thesis
Award
PhD
Metadata
Show full item recordFaculty
Science and Engineering
School
School of Molecular and Life Sciences
Collection
Abstract
The recovery of fingermark evidence from a crime scene can be vital to forensic investigations. Despite the wide variety of current detection methods, many fingermarks are never recovered. This thesis describes the use of synchrotron-sourced X-ray fluorescence microscopy and infrared spectroscopy to investigate the spatial distribution and relative amounts of organic and inorganic materials in latent fingermarks. The findings will help improve fingermark detection methods and assist with the interpretation of fingermark evidence.
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Zadnik, S.; Van Bronswijk, Wilhelm; Frick, Amanda; Fritz, Patrick; Lewis, Simon (2013)Commercially available fingermark simulants werecompared to latent fingermark deposits to assess their efficacy asstandards for a quality control assessment of fingermark developmentreagents. Deposits of the simulants and ...
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