Development of an improved field ionization detector incorporating a secondary electron stage
dc.contributor.author | Fahy, A. | |
dc.contributor.author | O’Donnell, Kane | |
dc.contributor.author | Barr, M. | |
dc.contributor.author | Zhou, X. | |
dc.contributor.author | Allison, W. | |
dc.contributor.author | Dastoor, P. | |
dc.date.accessioned | 2017-01-30T11:18:25Z | |
dc.date.available | 2017-01-30T11:18:25Z | |
dc.date.created | 2014-08-31T20:00:27Z | |
dc.date.issued | 2011 | |
dc.identifier.citation | Fahy, A. and O’Donnell, K. and Barr, M. and Zhou, X. and Allison, W. and Dastoor, P. 2011. Development of an improved field ionization detector incorporating a secondary electron stage. Measurement Science and Technology. 22: Article ID 115902. | |
dc.identifier.uri | http://hdl.handle.net/20.500.11937/10372 | |
dc.identifier.doi | 10.1088/0957-0233/22/11/115902 | |
dc.description.abstract |
Field ionization from sharp tips is attracting increased attention for use in detectors for neutral atomic/molecular species. However, the direct detection of the ionized species typically results in low sensitivities due to the small acceptance angle of the receiving ion-sensitive measurement device (usually a channel electron multiplier) and can result in sputtering damage due to the relatively high mass and energy of the incident ion species. Here we present a design for a field-ionization-based neutral atom detector incorporating a simple secondary electron generating stage. The use of such a stage decouples the field-ionized species from the detected electron signal, thus eliminating any sputtering damage to the channel electron multiplier. The detector armature discussed is shown to exhibit a linear response to neutral gas pressure and a sensitivity that is improved by more than two orders of magnitude over a previous field ionization detector design. | |
dc.publisher | IOP Publishing Ltd | |
dc.subject | neutral atom detection | |
dc.subject | helium atom microscopy | |
dc.subject | field ionization | |
dc.title | Development of an improved field ionization detector incorporating a secondary electron stage | |
dc.type | Journal Article | |
dcterms.source.volume | 22 | |
dcterms.source.number | 11 | |
dcterms.source.issn | 0957-0233 | |
dcterms.source.title | Measurement Science and Technology | |
curtin.department | Department of Imaging and Applied Physics | |
curtin.accessStatus | Fulltext not available |