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dc.contributor.authorFahy, A.
dc.contributor.authorO’Donnell, Kane
dc.contributor.authorBarr, M.
dc.contributor.authorZhou, X.
dc.contributor.authorAllison, W.
dc.contributor.authorDastoor, P.
dc.identifier.citationFahy, A. and O’Donnell, K. and Barr, M. and Zhou, X. and Allison, W. and Dastoor, P. 2011. Development of an improved field ionization detector incorporating a secondary electron stage. Measurement Science and Technology. 22: Article ID 115902.

Field ionization from sharp tips is attracting increased attention for use in detectors for neutral atomic/molecular species. However, the direct detection of the ionized species typically results in low sensitivities due to the small acceptance angle of the receiving ion-sensitive measurement device (usually a channel electron multiplier) and can result in sputtering damage due to the relatively high mass and energy of the incident ion species. Here we present a design for a field-ionization-based neutral atom detector incorporating a simple secondary electron generating stage. The use of such a stage decouples the field-ionized species from the detected electron signal, thus eliminating any sputtering damage to the channel electron multiplier. The detector armature discussed is shown to exhibit a linear response to neutral gas pressure and a sensitivity that is improved by more than two orders of magnitude over a previous field ionization detector design.

dc.publisherIOP Publishing Ltd
dc.subjectneutral atom detection
dc.subjecthelium atom microscopy
dc.subjectfield ionization
dc.titleDevelopment of an improved field ionization detector incorporating a secondary electron stage
dc.typeJournal Article
dcterms.source.titleMeasurement Science and Technology
curtin.departmentDepartment of Imaging and Applied Physics
curtin.accessStatusFulltext not available

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