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dc.contributor.authorPotdar, Vidyasagar
dc.contributor.authorChang, Elizabeth
dc.identifier.citationPotdar, Vidyasagar and Chang, Elizabeth. 2006. : Tamper detection in RFID tags, using, fragile watermarking, in Mohanty, S.P. and Sahoo, A. (ed), International Conference on Industrial Technology, Dec 15 2006, pp. 2846-2852. Mumbai, India: IEEE Computer Society Press.

Security and privacy are one of the two primary concerns with RFID (Radio Frequency Identification) adoption. While the mainstream RFID research is focused on solving the privacy issues, this paper focuses on security issues in general and data tampering in particular. We specifically consider the issue of detecting data tampering on the RFID tags for applications such as data integrity management. To address this issue, we present a novel fragile watermarking scheme, which embeds a fragile watermark (or pattern) in the serial number partition of the RFID tag. This pattern is verified to identify whether or not the data on the RFID tags has been tampered with. The novelty of this watermarking scheme lies in the fact that we have applied watermarking technology to RFID tags; in comparison, most of the existing watermarking schemes are limited to images, or audio or video applications. We term this scheme TamDetect because it is a tamper detection solution. TamDetect is designed such that it can be easily plugged into existing RFID middleware applications. This proposal is one of the first works that integrates watermarking and RFID technologies together. This paper provides a detailed theoretical foundation for the TamDetect solution.

dc.publisherIEEE Computer Society Press
dc.subjectRFID tags
dc.subjectfragile watermarking
dc.subjectdata integrity
dc.subjectdata tampering
dc.subjectradio frequency identification
dc.titleTamper detection in RFID tags, using, fragile watermarking
dc.typeConference Paper
dcterms.source.titleInternational Conference on Industrial Technology (ICIT 2006)
dcterms.source.seriesInternational Conference on Industrial Technology (ICIT 2006)
dcterms.source.conferenceInternational Conference on Industrial Technology
dcterms.source.conference-start-dateDec 15 2006
dcterms.source.conferencelocationMumbai, India

Copyright 2006 IEEE


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curtin.departmentCentre for Extended Enterprises and Business Intelligence
curtin.accessStatusOpen access
curtin.facultyCurtin Business School

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