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dc.contributor.authorKanazawa, Y.
dc.contributor.authorAsada, M.
dc.contributor.authorAsakuma, Y.
dc.contributor.authorHonda, I.
dc.contributor.authorPhan, Chi
dc.contributor.authorParmar, Harisinh Bhikhubhai
dc.contributor.authorPareek, Vishnu
dc.contributor.authorEvans, G.
dc.contributor.editorNobuhiro Aya
dc.contributor.editorNorihiko Iki
dc.contributor.editorTsutomu Shimura
dc.contributor.editorTomohiro Shirai
dc.date.accessioned2017-01-30T11:25:36Z
dc.date.available2017-01-30T11:25:36Z
dc.date.created2015-05-22T08:32:17Z
dc.date.issued2014
dc.identifier.citationKanazawa, Y. and Asada, M. and Asakuma, Y. and Honda, I. and Phan, C. and Parmar, H.B. and Pareek, V. et al. 2014. Convection and surface tension profiles for aqueous droplet under microwave radiation, in International Conference on Optical Particle Characterization, Mar 10 2014. Tokyo; Japan: SPIE.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/11573
dc.identifier.doi10.1117/12.2063433
dc.description.abstract

Surface tension of fluid is crucial for multiphase systems and is often manipulated during industrial processes by introducing surfactants. In this study, effect of microwave radiation on surface tension of aqueous solution was investigated for new physical method to manipulate the surface tension without using chemicals. It has found that surface tension profiles of aqueous solution during microwave are different with the salt concentration. Moreover, convections in the droplet during microwave radiation were compared to provide new understanding on the non-thermal effect of microwave.

dc.publisherSPIE
dc.subjectConvection
dc.subjectPIV
dc.subjectMicowave
dc.subjectSurfacetention
dc.titleConvection and surface tension profiles for aqueous droplet under microwave radiation
dc.typeConference Paper
dcterms.source.titleProc. SPIE 9232, International Conference on Optical Particle Characterization
dcterms.source.seriesProc. SPIE 9232, International Conference on Optical Particle Characterization
dcterms.source.isbn978-162841286-4
dcterms.source.conferenceInternational Conference on Optical Particle Characterization
dcterms.source.conference-start-dateMar 10 2014
dcterms.source.conferencelocationTokyo; Japan
dcterms.source.placeUnited States
curtin.departmentDepartment of Chemical Engineering
curtin.accessStatusFulltext not available


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