Convection and surface tension profiles for aqueous droplet under microwave radiation
dc.contributor.author | Kanazawa, Y. | |
dc.contributor.author | Asada, M. | |
dc.contributor.author | Asakuma, Y. | |
dc.contributor.author | Honda, I. | |
dc.contributor.author | Phan, Chi | |
dc.contributor.author | Parmar, Harisinh Bhikhubhai | |
dc.contributor.author | Pareek, Vishnu | |
dc.contributor.author | Evans, G. | |
dc.contributor.editor | Nobuhiro Aya | |
dc.contributor.editor | Norihiko Iki | |
dc.contributor.editor | Tsutomu Shimura | |
dc.contributor.editor | Tomohiro Shirai | |
dc.date.accessioned | 2017-01-30T11:25:36Z | |
dc.date.available | 2017-01-30T11:25:36Z | |
dc.date.created | 2015-05-22T08:32:17Z | |
dc.date.issued | 2014 | |
dc.identifier.citation | Kanazawa, Y. and Asada, M. and Asakuma, Y. and Honda, I. and Phan, C. and Parmar, H.B. and Pareek, V. et al. 2014. Convection and surface tension profiles for aqueous droplet under microwave radiation, in International Conference on Optical Particle Characterization, Mar 10 2014. Tokyo; Japan: SPIE. | |
dc.identifier.uri | http://hdl.handle.net/20.500.11937/11573 | |
dc.identifier.doi | 10.1117/12.2063433 | |
dc.description.abstract |
Surface tension of fluid is crucial for multiphase systems and is often manipulated during industrial processes by introducing surfactants. In this study, effect of microwave radiation on surface tension of aqueous solution was investigated for new physical method to manipulate the surface tension without using chemicals. It has found that surface tension profiles of aqueous solution during microwave are different with the salt concentration. Moreover, convections in the droplet during microwave radiation were compared to provide new understanding on the non-thermal effect of microwave. | |
dc.publisher | SPIE | |
dc.subject | Convection | |
dc.subject | PIV | |
dc.subject | Micowave | |
dc.subject | Surfacetention | |
dc.title | Convection and surface tension profiles for aqueous droplet under microwave radiation | |
dc.type | Conference Paper | |
dcterms.source.title | Proc. SPIE 9232, International Conference on Optical Particle Characterization | |
dcterms.source.series | Proc. SPIE 9232, International Conference on Optical Particle Characterization | |
dcterms.source.isbn | 978-162841286-4 | |
dcterms.source.conference | International Conference on Optical Particle Characterization | |
dcterms.source.conference-start-date | Mar 10 2014 | |
dcterms.source.conferencelocation | Tokyo; Japan | |
dcterms.source.place | United States | |
curtin.department | Department of Chemical Engineering | |
curtin.accessStatus | Fulltext not available |