Show simple item record

dc.contributor.authorPodolska, Anna
dc.contributor.authorKocan, M.
dc.contributor.authorGarces Cabezas, A.
dc.contributor.authorWilson, T.
dc.contributor.authorUmana-Membreno, G.
dc.contributor.authorNener, B.
dc.contributor.authorParish, G.
dc.contributor.authorKeller, S.
dc.contributor.authorMishra, U.
dc.date.accessioned2017-01-30T11:26:07Z
dc.date.available2017-01-30T11:26:07Z
dc.date.created2014-04-06T20:00:38Z
dc.date.issued2010
dc.identifier.citationPodolska, Anna and Kocan, Martin and Garces Cabezas, Alex M. and Wilson, Timothy D. and Umana-Membreno, Gilberto A. and Nener, Brett D. and Parish, Giacinta and Keller, Stacia and Mishra, Umesh K. 2010. Ion versus pH sensitivity of ungated AlGaN/GaN heterostructure-based devices. Applied Physics Letters 97: Article ID 012108.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/11642
dc.identifier.doi10.1063/1.3462323
dc.description.abstract

We have investigated the pH and ion sensitivity of AlGaN/GaN heterostructure devices; these devices are sensitive to the ion concentration rather than to the pH of the solution. Sheet resistance as a function of pH for calibrated pH solutions and dilute NaOH, HCl, KOH, and NaCl showed an increase as a function of ionic concentration, regardless of whether the pH was acidic, basic, or neutral. An increase in resistance corresponds to accumulation of negative ions at the AlGaN surface, indicating device selectivity toward the negative ions. We attribute this to the formation of a double layer at the liquid/semiconductor interface.

dc.publisherAmerican Institute of Physics
dc.titleIon versus pH sensitivity of ungated AlGaN/GaN heterostructure-based devices
dc.typeJournal Article
dcterms.source.volume97
dcterms.source.startPage102
dcterms.source.endPage108
dcterms.source.issn00036951
dcterms.source.titleAppl. Phys. Lett.
curtin.department
curtin.accessStatusFulltext not available


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record