Electron-helium S-wave model benchmark calculations. II. Double ionization, single ionization with excitation, and double excitation
dc.contributor.author | Bartlett, P. | |
dc.contributor.author | Stelbovics, Andris | |
dc.date.accessioned | 2017-01-30T11:30:17Z | |
dc.date.available | 2017-01-30T11:30:17Z | |
dc.date.created | 2011-03-30T20:01:48Z | |
dc.date.issued | 2010 | |
dc.identifier.citation | Bartlett, Philip L. and Stelbovics, Andris T. 2010. Electron-helium S-wave model benchmark calculations. II. Double ionization, single ionization with excitation, and double excitation. Physical Review A. 81 (2): pp. 022716-1 - 022716-9. | |
dc.identifier.uri | http://hdl.handle.net/20.500.11937/12349 | |
dc.identifier.doi | 10.1103/PhysRevA.81.022716 | |
dc.description.abstract |
The propagating exterior complex scaling (PECS) method is extended to all four-body processes in electron impact on helium in an S-wave model. Total and energy-differential cross sections are presented with benchmark accuracy for double ionization, single ionization with excitation, and double excitation (to autoionizing states) for incident-electron energies from threshold to 500 eV. While the PECS three-body cross sections for this model given in the preceding article [ Phys. Rev. A 81 022715 (2010)] are in good agreement with other methods, there are considerable discrepancies for these four-body processes. With this model we demonstrate the suitability of the PECS method for the complete solution of the electron-helium system. | |
dc.publisher | American Physical Society | |
dc.title | Electron-helium S-wave model benchmark calculations. II. Double ionization, single ionization with excitation, and double excitation | |
dc.type | Journal Article | |
dcterms.source.volume | 81 | |
dcterms.source.startPage | 022716 | |
dcterms.source.endPage | 1 | |
dcterms.source.issn | 1050-2947 | |
dcterms.source.title | Physical Review A | |
curtin.department | Department of Imaging and Applied Physics | |
curtin.accessStatus | Fulltext not available |