A Basis Set for Characterizing Transient Random Phenomena
| dc.contributor.author | Howard, Roy | |
| dc.contributor.editor | M. Macucci | |
| dc.contributor.editor | G. Basso | |
| dc.date.accessioned | 2017-01-30T11:40:14Z | |
| dc.date.available | 2017-01-30T11:40:14Z | |
| dc.date.created | 2010-03-29T20:04:47Z | |
| dc.date.issued | 2009 | |
| dc.identifier.citation | Howard, Roy M. 2009. A Basis Set for Characterizing Transient Random Phenomena, in Macucci, M. and Basso, G. (ed), 20th International Conference on Noise and Fluctuations, pp. 29-32. Pisa: American Institute of Physics. | |
| dc.identifier.uri | http://hdl.handle.net/20.500.11937/13923 | |
| dc.identifier.doi | 10.1063/1.3140457 | |
| dc.description.abstract |
An orthogonal basis consistent with transient random phenomena is proposed and applied to market data and 1/ƒ noise. For 1/ƒ noise the power-rate spectrum is flat. The basis set leads to a power-rate spectrum and can be used to facilitate the detection of specific signal forms. | |
| dc.publisher | American Institute of Physics | |
| dc.title | A Basis Set for Characterizing Transient Random Phenomena | |
| dc.type | Conference Paper | |
| dcterms.source.startPage | 29 | |
| dcterms.source.endPage | 32 | |
| dcterms.source.title | Fluctuations and Noise: 20th International Conference on Noise and Fluctuations | |
| dcterms.source.series | Fluctuations and Noise: 20th International Conference on Noise and Fluctuations | |
| dcterms.source.isbn | 9780735406650 | |
| dcterms.source.conference | 20th International Conference on Noise and Fluctuations | |
| dcterms.source.conference-start-date | Jun 14 2009 | |
| dcterms.source.conferencelocation | Pisa, Italy | |
| dcterms.source.place | Melville, New York, USA | |
| curtin.note |
Copyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Howard, Roy M. 2009. A Basis Set for Characterizing Transient Random Phenomena, in Macucci, M. and Basso, G. (ed), 20th International Conference on Noise and Fluctuations, pp. 29-32. Pisa: American Institute of Physics. And may be found at | |
| curtin.accessStatus | Open access | |
| curtin.faculty | Department of Electrical and Computer Engineering | |
| curtin.faculty | School of Engineering | |
| curtin.faculty | Faculty of Science and Engineering |