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dc.contributor.authorAn, Senjian
dc.contributor.authorLiu, Wan-Quan
dc.contributor.authorVenkatesh, Svetha
dc.contributor.editorY.Y. Tang, S.P.Wang, G. Lorette, D.S. Young, H. Yang
dc.date.accessioned2017-01-30T11:46:58Z
dc.date.available2017-01-30T11:46:58Z
dc.date.created2014-10-28T02:23:12Z
dc.date.issued2006
dc.identifier.citationAn, S. and Liu, W. and Venkatesh, S. 2006. Efficient Cross-validation of the complete Two stages in KFD Classifier Formulation, in Tang, Y.Y. et al(ed), Proceedings of the 18th International Conference on Pattern Recognition, Aug 20-24 2006, pp. 240-244. Hong Kong: IEEE.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/14950
dc.identifier.doi10.1109/ICPR.2006.473
dc.description.abstract

This paper presents an efficient evaluation algorithm for cross-validating the two-stage approach of KFD classifiers. The proposed algorithm is of the same complexity level as the existing indirect efficient cross-validation methods but it is more reliable since it is direct and constitutes exact cross-validation for the KFD classifier formulation. Simulations demonstrate that the proposed algorithm is almost as fast as the existing fast indirect evaluation algorithm and the two-stage cross-validation selects better models on most of the thirteen benchmark data sets.

dc.publisherIEEE Coputer Society Conference Publishing Services
dc.titleEfficient Cross-validation of the complete Two stages in KFD Classifier Formulation
dc.typeConference Paper
dcterms.source.startPage240
dcterms.source.endPage244
dcterms.source.titleProceedings of the 18th International Conference on Pattern Recognition Vol 3
dcterms.source.seriesProceedings of the 18th International Conference on Pattern Recognition Vol 3
dcterms.source.isbn0769525210
dcterms.source.conference18th International Conference on Pattern Recognition
dcterms.source.conference-start-dateAug 20 2006
dcterms.source.conferencelocationHong Kong
dcterms.source.placeLos Alamitos, USA
curtin.departmentDepartment of Computing
curtin.accessStatusFulltext not available


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