Efficient Cross-validation of the complete Two stages in KFD Classifier Formulation
dc.contributor.author | An, Senjian | |
dc.contributor.author | Liu, Wan-Quan | |
dc.contributor.author | Venkatesh, Svetha | |
dc.contributor.editor | Y.Y. Tang | |
dc.contributor.editor | S.P.Wang | |
dc.contributor.editor | G. Lorette | |
dc.contributor.editor | D.S. Young | |
dc.contributor.editor | H. Yang | |
dc.date.accessioned | 2017-01-30T11:46:58Z | |
dc.date.available | 2017-01-30T11:46:58Z | |
dc.date.created | 2014-10-28T02:23:12Z | |
dc.date.issued | 2006 | |
dc.identifier.citation | An, S. and Liu, W. and Venkatesh, S. 2006. Efficient Cross-validation of the complete Two stages in KFD Classifier Formulation, in Tang, Y.Y. et al(ed), Proceedings of the 18th International Conference on Pattern Recognition, Aug 20-24 2006, pp. 240-244. Hong Kong: IEEE. | |
dc.identifier.uri | http://hdl.handle.net/20.500.11937/14950 | |
dc.identifier.doi | 10.1109/ICPR.2006.473 | |
dc.description.abstract |
This paper presents an efficient evaluation algorithm for cross-validating the two-stage approach of KFD classifiers. The proposed algorithm is of the same complexity level as the existing indirect efficient cross-validation methods but it is more reliable since it is direct and constitutes exact cross-validation for the KFD classifier formulation. Simulations demonstrate that the proposed algorithm is almost as fast as the existing fast indirect evaluation algorithm and the two-stage cross-validation selects better models on most of the thirteen benchmark data sets. | |
dc.publisher | IEEE Coputer Society Conference Publishing Services | |
dc.title | Efficient Cross-validation of the complete Two stages in KFD Classifier Formulation | |
dc.type | Conference Paper | |
dcterms.source.startPage | 240 | |
dcterms.source.endPage | 244 | |
dcterms.source.title | Proceedings of the 18th International Conference on Pattern Recognition Vol 3 | |
dcterms.source.series | Proceedings of the 18th International Conference on Pattern Recognition Vol 3 | |
dcterms.source.isbn | 0769525210 | |
dcterms.source.conference | 18th International Conference on Pattern Recognition | |
dcterms.source.conference-start-date | Aug 20 2006 | |
dcterms.source.conferencelocation | Hong Kong | |
dcterms.source.place | Los Alamitos, USA | |
curtin.department | Department of Computing | |
curtin.accessStatus | Fulltext not available |