| dc.contributor.author | Higashiyama, Yoichi | |
| dc.contributor.author | Cai, X. | |
| dc.contributor.author | Rumchev, Ventseslav | |
| dc.contributor.editor | Hoang Pham | |
| dc.contributor.editor | Toshio Nakagaw | |
| dc.date.accessioned | 2017-01-30T12:17:58Z | |
| dc.date.available | 2017-01-30T12:17:58Z | |
| dc.date.created | 2010-03-23T20:02:58Z | |
| dc.date.issued | 2009 | |
| dc.identifier.citation | Higashiyama, Yoichi and Cai, Xu and Rumchev, Ventseslav. 2009. A symbolic reliability formula using SDP method for weighted-k-out-of-n system, in Hoang Pham and Toshio Nakagaw (ed), 15th ISSAT International Conference on Reliability and Quality in Design, Aug 6 2009, pp. 305-309. San Francisco, California, USA: International Society of Science and Applied Technologies. | |
| dc.identifier.uri | http://hdl.handle.net/20.500.11937/20209 | |
| dc.publisher | International Society of Science and Applied Technologies | |
| dc.title | A symbolic reliability formula using SDP method for weighted-k-out-of-n system | |
| dc.type | Conference Paper | |
| dcterms.source.startPage | 305 | |
| dcterms.source.endPage | 309 | |
| dcterms.source.title | 15th ISSAT International Conference on Reliability and Quality in Design | |
| dcterms.source.series | 15th ISSAT International Conference on Reliability and Quality in Design | |
| dcterms.source.isbn | 978-0-9763486-5-8 | |
| dcterms.source.conference | 15th ISSAT International Conference on Reliability and Quality in Design | |
| dcterms.source.conference-start-date | Aug 6 2009 | |
| dcterms.source.conferencelocation | San Francisco, California, USA | |
| dcterms.source.place | Piscataway NJ | |
| curtin.accessStatus | Fulltext not available | |
| curtin.faculty | School of Science and Computing | |
| curtin.faculty | Department of Mathematics and Statistics | |
| curtin.faculty | Faculty of Science and Engineering | |
