Show simple item record

dc.contributor.authorHigashiyama, Yoichi
dc.contributor.authorRumchev, Ventseslav
dc.contributor.editorToshio Nakagawa
dc.contributor.editorHoang Pham
dc.contributor.editorShigeru Yamada
dc.date.accessioned2017-01-30T12:31:31Z
dc.date.available2017-01-30T12:31:31Z
dc.date.created2009-03-05T00:58:17Z
dc.date.issued2007
dc.identifier.citationHigashiyama, Yoichi and Rumchev, Ventseslav. 2007. A method for exact reliability of consecutive 2-out-of-(r,r)-from-(n,n): F system, in Toshio Nakagawa, Hoang Pham, Shigeru Yamada (ed), 13th ISSAT International Conference on Reliability and Quality in Design, Aug 2 2007, pp. 201-205. Seattle, USA: International Society of Science and Applied Technologies.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/22460
dc.publisherInternational Society of Science and Applied Technologies
dc.titleA method for exact reliability of consecutive 2-out-of-(r,r)-from-(n,n): F system
dc.typeConference Paper
dcterms.source.startPage201
dcterms.source.endPage205
dcterms.source.titleProceedings of the Thirteenth ISSAT International Conference on Reliability and Quality in Design2007
dcterms.source.seriesProceedings of the Thirteenth ISSAT International Conference on Reliability and Quality in Design2007
dcterms.source.isbn9780976348627
dcterms.source.conference13th ISSAT International Conference on Reliability and Quality in Design
dcterms.source.conference-start-dateAug 2 2007
dcterms.source.conferencelocationSeattle, USA
dcterms.source.placePiscataway, NJ, U.S.A.
curtin.accessStatusFulltext not available
curtin.facultySchool of Science and Computing
curtin.facultyDepartment of Mathematics and Statistics
curtin.facultyFaculty of Science and Engineering


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record