dc.contributor.author | Higashiyama, Yoichi | |
dc.contributor.author | Rumchev, Ventseslav | |
dc.contributor.editor | Toshio Nakagawa | |
dc.contributor.editor | Hoang Pham | |
dc.contributor.editor | Shigeru Yamada | |
dc.date.accessioned | 2017-01-30T12:31:31Z | |
dc.date.available | 2017-01-30T12:31:31Z | |
dc.date.created | 2009-03-05T00:58:17Z | |
dc.date.issued | 2007 | |
dc.identifier.citation | Higashiyama, Yoichi and Rumchev, Ventseslav. 2007. A method for exact reliability of consecutive 2-out-of-(r,r)-from-(n,n): F system, in Toshio Nakagawa, Hoang Pham, Shigeru Yamada (ed), 13th ISSAT International Conference on Reliability and Quality in Design, Aug 2 2007, pp. 201-205. Seattle, USA: International Society of Science and Applied Technologies. | |
dc.identifier.uri | http://hdl.handle.net/20.500.11937/22460 | |
dc.publisher | International Society of Science and Applied Technologies | |
dc.title | A method for exact reliability of consecutive 2-out-of-(r,r)-from-(n,n): F system | |
dc.type | Conference Paper | |
dcterms.source.startPage | 201 | |
dcterms.source.endPage | 205 | |
dcterms.source.title | Proceedings of the Thirteenth ISSAT International Conference on Reliability and Quality in Design2007 | |
dcterms.source.series | Proceedings of the Thirteenth ISSAT International Conference on Reliability and Quality in Design2007 | |
dcterms.source.isbn | 9780976348627 | |
dcterms.source.conference | 13th ISSAT International Conference on Reliability and Quality in Design | |
dcterms.source.conference-start-date | Aug 2 2007 | |
dcterms.source.conferencelocation | Seattle, USA | |
dcterms.source.place | Piscataway, NJ, U.S.A. | |
curtin.accessStatus | Fulltext not available | |
curtin.faculty | School of Science and Computing | |
curtin.faculty | Department of Mathematics and Statistics | |
curtin.faculty | Faculty of Science and Engineering | |