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    A surface-patterned chip as a strong source of ultracold atoms for quantum technologies

    Access Status
    Fulltext not available
    Authors
    Nshii, C.
    Vangeleyn, M.
    Cotter, J.
    Griffin, P.
    Hinds, E.
    Ironside, Charlie
    See, P.
    Sinclair, A.
    Riis, E.
    Arnold, A.
    Date
    2013
    Type
    Journal Article
    
    Metadata
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    Citation
    Nshii, C. and Vangeleyn, M. and Cotter, J. and Griffin, P. and Hinds, E. and Ironside, C. and See, P. et al. 2013. A surface-patterned chip as a strong source of ultracold atoms for quantum technologies. Nature Nanotechnology. 8 (5): pp. 321-324.
    Source Title
    Nature Nanotechnology
    DOI
    10.1038/nnano.2013.47
    ISSN
    1748-3387
    School
    Department of Physics and Astronomy
    URI
    http://hdl.handle.net/20.500.11937/33709
    Collection
    • Curtin Research Publications
    Abstract

    Laser-cooled atoms are central to modern precision measurements. They are also increasingly important as an enabling technology for experimental cavity quantum electrodynamics, quantum information processing and matter-wave interferometry. Although significant progress has been made in miniaturizing atomic metrological devices, these are limited in accuracy by their use of hot atomic ensembles and buffer gases. Advances have also been made in producing portable apparatus that benefits from the advantages of atoms in the microkelvin regime. However, simplifying atomic cooling and loading using microfabrication technology has proved difficult. In this Letter we address this problem, realizing an atom chip that enables the integration of laser cooling and trapping into a compact apparatus. Our source delivers ten thousand times more atoms than previous magneto-optical traps with microfabricated optics and, for the first time, can reach sub-Doppler temperatures. Moreover, the same chip design offers a simple way to form stable optical lattices. These features, combined with simplicity of fabrication and ease of operation, make these new traps a key advance in the development of cold-atom technology for high-accuracy, portable measurement devices. © 2013 Macmillan Publishers Limited. All rights reserved.

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