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dc.contributor.authorChan, Kit Yan
dc.contributor.authorLing, S.H.
dc.contributor.authorDillon, Tharam S.
dc.contributor.authorNguyen, H.
dc.contributor.editorGary Fogel
dc.date.accessioned2017-01-30T13:41:04Z
dc.date.available2017-01-30T13:41:04Z
dc.date.created2011-03-13T20:01:59Z
dc.date.issued2010
dc.identifier.citationChan, Kit Yan and Ling, Sing Ho and Dillon, Tharam S. and Nguyen, Hung. 2010. Classification of hypoglycemic episodes for Type 1 diabetes mellitus based on neural networks, in Fogel, G. (ed), IEEE Congress on Evolutionary Computation (CEC 2010), Jul 18 2010, pp. 1-5. Barcelona, Spain: IEEE.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/34068
dc.identifier.doi10.1109/CEC.2010.5586320
dc.description.abstract

Hypoglycemia is dangerous for Type 1 diabetes mellitus (T1DM) patients. Based on the physiological parameters, we have developed a classification unit with hybridizing the approaches of neural networks and genetic algorithm to identify the presences of hypoglycemic episodes for TIDM patients. The proposed classification unit is built and is validated by using the real T1DM patients' data sets collected from Department of Health, Government of Western Australia. Experimental results show that the proposed neural network based classification unit can achieve more accurate results on both trained and unseen T1DM patients' data sets compared with those developed based on the commonly used classification methods for medical diagnosis including statistical regression, fuzzy regression and genetic programming.

dc.publisherIEEE
dc.titleClassification of hypoglycemic episodes for Type 1 diabetes mellitus based on neural networks
dc.typeConference Paper
dcterms.source.startPage1
dcterms.source.endPage5
dcterms.source.titleProceedings of the IEEE congress on evolutionary computation (CEC 2010)
dcterms.source.seriesProceedings of the IEEE congress on evolutionary computation (CEC 2010)
dcterms.source.isbn9781424469093
dcterms.source.conferenceIEEE Congress on Evolutionary Computation (CEC 2010)
dcterms.source.conference-start-dateJul 18 2010
dcterms.source.conferencelocationBarcelona, Spain
dcterms.source.placeSpain
curtin.note

Copyright © 2010 IEEE This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.

curtin.departmentDigital Ecosystems and Business Intelligence Institute (DEBII)
curtin.accessStatusOpen access


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