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dc.contributor.authorMao, W.
dc.contributor.authorChen, Q.
dc.contributor.authorDai, C.
dc.contributor.authorYang, L.
dc.contributor.authorZhou, Y.
dc.contributor.authorLu, Chungsheng
dc.date.accessioned2017-01-30T13:46:21Z
dc.date.available2017-01-30T13:46:21Z
dc.date.created2010-10-28T20:02:54Z
dc.date.issued2010
dc.identifier.citationMao, W.G. and Chen, Q. and Dai, C.Y. and Yang, L.and Zhou, Y.C. and Lu, C. 2010. Effects of piezo-spectroscopic coefficients of 8 wt.% Y2O3 stabilized ZrO2 on residual stress measurement of thermal barrier coatings by Raman spectroscopy. Surface and Coatings Technology. 204 (21-22): pp. 3573-3577.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/34895
dc.identifier.doi10.1016/j.surfcoat.2010.04.024
dc.publisherElsevier S.A
dc.titleEffects of piezo-spectroscopic coefficients of 8 wt.% Y2O3 stabilized ZrO2 on residual stress measurement of thermal barrier coatings by Raman spectroscopy
dc.typeJournal Article
dcterms.source.volume204
dcterms.source.number21-22
dcterms.source.startPage3573
dcterms.source.endPage3577
dcterms.source.issn0257-8972
dcterms.source.titleSurface & Coatings Technology
curtin.note

The link to the journal’s home page is: http://www.elsevier.com/wps/find/journaldescription.cws_home/504101/description#description. Copyright © 2010 Elsevier B.V. All rights reserved

curtin.accessStatusOpen access
curtin.facultySchool of Engineering
curtin.facultyFaculty of Science and Engineering
curtin.facultyDepartment of Mechanical Engineering


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