A measure of competence based on randomized reference classifier for dynamic ensemble selection
dc.contributor.author | Woloszynski, Tomasz | |
dc.contributor.author | Kurzynski, M. | |
dc.date.accessioned | 2017-01-30T13:59:43Z | |
dc.date.available | 2017-01-30T13:59:43Z | |
dc.date.created | 2016-09-12T08:36:40Z | |
dc.date.issued | 2010 | |
dc.identifier.citation | Woloszynski, T. and Kurzynski, M. 2010. A measure of competence based on randomized reference classifier for dynamic ensemble selection, pp. 4194-4197. | |
dc.identifier.uri | http://hdl.handle.net/20.500.11937/37118 | |
dc.identifier.doi | 10.1109/ICPR.2010.1019 | |
dc.description.abstract |
This paper presents a measure of competence based on a randomized reference classifier (RRC) for classifier ensembles. The RRC can be used to model, in terms of class supports, any classifier in the ensemble. The competence of a modelled classifier is calculated as the probability of correct classification of the respective RRC. A multiple classifier system (MCS) was developed and its performance was compared against five MCSs using eight databases taken from the UCI Machine Learning Repository. The system developed achieved the highest overall classification accuracies for both homogeneous and heterogeneous ensembles. © 2010 IEEE. | |
dc.title | A measure of competence based on randomized reference classifier for dynamic ensemble selection | |
dc.type | Conference Paper | |
dcterms.source.startPage | 4194 | |
dcterms.source.endPage | 4197 | |
dcterms.source.title | Proceedings - International Conference on Pattern Recognition | |
dcterms.source.series | Proceedings - International Conference on Pattern Recognition | |
dcterms.source.isbn | 9780769541099 | |
curtin.department | Department of Mechanical Engineering | |
curtin.accessStatus | Fulltext not available |
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