Water on Silicon (001): C-defects and Initial Steps of Surface Oxidation
| dc.contributor.author | Warschkow, O. | |
| dc.contributor.author | Schofield, S. | |
| dc.contributor.author | Marks, Nigel | |
| dc.contributor.author | Radny, M. | |
| dc.contributor.author | Smith, P. | |
| dc.contributor.author | McKenzie, D. | |
| dc.date.accessioned | 2017-01-30T14:16:01Z | |
| dc.date.available | 2017-01-30T14:16:01Z | |
| dc.date.created | 2014-10-08T03:10:53Z | |
| dc.date.issued | 2008 | |
| dc.identifier.citation | Warschkow, O. and Schofield, S. and Marks, N. and Radny, M. and Smith, P. and McKenzie, D. 2008. Water on Silicon (001): C-defects and Initial Steps of Surface Oxidation. Physical Review B. 77 (20): pp. 201305-201309. | |
| dc.identifier.uri | http://hdl.handle.net/20.500.11937/38245 | |
| dc.publisher | American Physical Society | |
| dc.title | Water on Silicon (001): C-defects and Initial Steps of Surface Oxidation | |
| dc.type | Journal Article | |
| dcterms.source.volume | 77 | |
| dcterms.source.number | 20 | |
| dcterms.source.startPage | 201305 | |
| dcterms.source.endPage | 201309 | |
| dcterms.source.issn | 1098-0121 | |
| dcterms.source.title | Physical Review B | |
| curtin.accessStatus | Fulltext not available |