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dc.contributor.authorHoward, Roy
dc.contributor.editorLuca Varani
dc.contributor.editorFabien Pascal
dc.contributor.editorJean-Marc Routoure
dc.date.accessioned2017-01-30T14:37:57Z
dc.date.available2017-01-30T14:37:57Z
dc.date.created2013-09-02T20:00:21Z
dc.date.issued2013
dc.identifier.citationHoward, Roy. 2013. Modelling the PDF Evolution in a CMOS Inverter during Switching, in Luca Varani, Fabien Pascal & Jean-Marc Routoure (ed), 22nd International Conference on Noise and Fluctuations, Jun 24 2013. Montpellier, France: IEEE.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/39889
dc.identifier.doi10.1109/ICNF.2013.6578962
dc.description.abstract

A model which facilitates the simulation of switching in a CMOS inverter, and a model for the associated PDF evolution, are proposed. The latter model is based on a Gaussian basis set. Simulation results, for the additive Gaussian white noise case, show, first, that the Gaussian assumption for the probability density function of the output jitter is valid at high input noise levels but with deviations from the Gaussian form for the propagation delay. Second, the output noise variance at a set time varies and is a maximum close to the midpoint between the high and low states. Third, the rms jitter of the output signal increases with the input rise time and the output load capacitance but decreases with increasing noise bandwidth. Fourth, the high correlation between the input and output signals leads to lower propagation delay jitter than expected.

dc.publisherIEEE
dc.subjectPDF evolution
dc.subjectCMOS inverter
dc.subjectjitter
dc.subjectswitching
dc.titleModelling the PDF Evolution in a CMOS Inverter during Switching
dc.typeConference Paper
dcterms.source.titleProceedings of the 22nd International Conference on Noise and Fluctuations
dcterms.source.seriesProceedings of the 22nd International Conference on Noise and Fluctuations
dcterms.source.isbn9781479906703
dcterms.source.conference22nd International Conference on Noise and Fluctuations
dcterms.source.conference-start-dateJun 24 2013
dcterms.source.conferencelocationMontpellier, France
dcterms.source.placeElectronic: IEEE 445 Hoes Lane, Piscataway, NJ 08854.
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