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dc.contributor.authorMaric, Mark
dc.contributor.authorSohail, M.
dc.contributor.authorDe Marco, Roland
dc.date.accessioned2017-01-30T15:02:15Z
dc.date.available2017-01-30T15:02:15Z
dc.date.created2014-05-07T20:00:21Z
dc.date.issued2014
dc.identifier.citationMaric, Mark and Sohail, Manzar and De Marco, Roland. 2014. A near edge X-ray absorption fine structure (NEXAFS) study of the response mechanism of the iron (III) chalcogenide glass membrane ion-selective electrode. Electrochemistry Communications. 41: pp. 27-30.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/42803
dc.identifier.doi10.1016/j.elecom.2014.01.017
dc.description.abstract

We have utilized synchrotron radiation-X-ray photoelectron spectroscopy (SR-XPS) and near edge X-ray absorption fine structure (NEXAFS) to demonstrate unequivocally that the modified surface layer (MSL) of the iron chalcogenide glass ion-selective electrode (ISE) comprises a mixture of iron(II) and iron(III) redox states, as proposed in previous theories to explain the mixed electron transfer and ion exchange response mechanism of this analytically important ISE.

dc.publisherElsevier Inc.
dc.subjectChalcogenide glass membrane
dc.subjectIron(III) ISE
dc.subjectXPS
dc.subjectNEXAFS
dc.subjectElectrode mechanism
dc.titleA near edge X-ray absorption fine structure (NEXAFS) study of the response mechanism of the iron (III) chalcogenide glass membrane ion-selective electrode
dc.typeJournal Article
dcterms.source.volume41
dcterms.source.startPage27
dcterms.source.endPage30
dcterms.source.issn1388-2481
dcterms.source.titleElectrochemistry Communications
curtin.department
curtin.accessStatusFulltext not available


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