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dc.contributor.authorJohnson, J.
dc.contributor.authorJohnson, Genevieve
dc.contributor.authorCavanagh, Rob
dc.contributor.editorYi Zhao
dc.date.accessioned2017-01-30T15:08:43Z
dc.date.available2017-01-30T15:08:43Z
dc.date.created2013-03-20T20:00:44Z
dc.date.issued2012
dc.identifier.citationJohnson, Julia Ann and Johnson, Genevieve Marie and Cavanagh, Robert F. 2012. Rough sets for mining educational data, in Proceedings of the 2012 Spring World Congress on Engineering and Technology (SCET 2012): Sharing, Cooperating and Improving, May 27-30 2012, pp. 131-134. Xi'an, China: Institute of Electrical and Electronic Engineers.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/43611
dc.identifier.doi10.1109/SCET.2012.6341891
dc.description.abstract

While educational data are typically analyzed with statistical software, data mining techniques are increasingly appropriate in revealing complex relationships among multiple variables in large amounts of data. We experimented with the rough set method in conjunction with statistical analysis to identify patterns in, and thereby extract meaning from, complex educational data. Results establish the benefits of combining rough set decision making with stochastic analysis in mining exceedingly complex and difficult to interpret educational data sets.

dc.publisherInstitute of Electrical and Electronic Engineers
dc.subjectdata mining
dc.subjectuncertain reasoning
dc.subjecteducational data
dc.subjectrough sets
dc.titleRough sets for mining educational data
dc.typeConference Paper
dcterms.source.startPage131
dcterms.source.endPage134
dcterms.source.titleProceedings of the Spring World Congress on Engineering and Technology
dcterms.source.seriesProceedings of the Spring World Congress on Engineering and Technology
dcterms.source.isbn9781457719646
dcterms.source.conference2012 Spring World Congress on Engineering and Technology
dcterms.source.conference-start-dateMay 27 2012
dcterms.source.conferencelocationXi'an Chin, China
dcterms.source.placeRed Hook, New York, USA
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NOTICE: This is the author’s version of a work in which changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication.

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Copyright © 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

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