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dc.contributor.authorBennett, J.
dc.contributor.authorWarschkow, O.
dc.contributor.authorMarks, Nigel
dc.date.accessioned2017-01-30T15:08:52Z
dc.date.available2017-01-30T15:08:52Z
dc.date.created2014-09-09T20:01:03Z
dc.date.issued2009
dc.identifier.citationBennett, J. and Warschkow, O. and Marks, N. 2009. Aminoxyl Radicals on the Silicon (001) Surface. Journal of Physical Chemistry C. 113 (3): pp. 1020-1027.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/43639
dc.identifier.doi10.1021/jp8065772
dc.description.abstract

Aminoxyl radicals form a class of persistent radical species of which the TEMPO (2,2,6,6-tetramethyl-1-piperidinyloxy) molecule is perhaps the best known. They are known to be dangling bond scavengers and bind readily to the silicon (001) surface. However, the possibility of the aminoxyl group reacting dissociatively with the surface has been largely ignored. Density functional theory is used to investigate possible reaction pathways for the simplest aminoxyl radical, H2NO, on silicon. We consider same-site, same-dimer, and adjacent-dimer dissociation pathways and find that H2NO dissociates readily in the presence of neighboring free dimers or dangling bonds. Further calculations examine the applicability of these findings to the larger dimethyl aminoxyl and TEMPO molecules.

dc.publisherAmerican Chemical Society
dc.subjectSurface chemical reactions
dc.subjectTEMPO
dc.subjectmolecular electronics
dc.subjectDensity functional calculations
dc.titleAminoxyl Radicals on the Silicon (001) Surface
dc.typeJournal Article
dcterms.source.volume113
dcterms.source.number3
dcterms.source.startPage1020
dcterms.source.endPage1027
dcterms.source.issn1932-7447
dcterms.source.titleJournal of Physical Chemistry C
curtin.accessStatusFulltext not available


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