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    Workfunction variation across surface of an H-terminated diamond film measured using Kelvin probe force microscopy

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    Fulltext not available
    Authors
    Lay, J.
    O'Donnell, Kane
    May, P.
    Date
    2011
    Type
    Journal Article
    
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    Citation
    Lay, J. and O'Donnell, K. and May, P. 2011. Workfunction variation across surface of an H-terminated diamond film measured using Kelvin probe force microscopy. Chemical Physics Letters. 515 (1): pp. 151-154.
    Source Title
    Chemical Physics Letters
    DOI
    10.1016/j.cplett.2011.09.023
    ISSN
    0009-2614
    School
    Department of Imaging and Applied Physics
    URI
    http://hdl.handle.net/20.500.11937/45567
    Collection
    • Curtin Research Publications
    Abstract

    With the ability to image both topography and contact potential difference simultaneously, Kelvin probe force microscopy (KPM) is an effective tool for the electrical characterisation of diamond surfaces. In this work we measure variations in contact potential difference across the surfaces of boron-doped diamond films in order to investigate work function variations caused by surface features. Significantly, we demonstrate work function variations in excess of 300 mV across the surfaces of two differently prepared diamond films. Variations of this magnitude may have implications for the use of diamond in a number of electronic applications.

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