An Electrochemical Method to Assess the Chromium Volatility of Chromia-Forming Metallic Interconnect for SOFCs

dc.contributor.author	Jiang, San Ping
dc.contributor.author	Zhen, Y.
dc.contributor.author	Zhang, S.
dc.contributor.author	Tok, A.I.Y.
dc.contributor.author	Wu, P.
dc.date.accessioned	2017-01-30T10:40:55Z
dc.date.available	2017-01-30T10:40:55Z
dc.date.created	2014-10-08T05:25:30Z
dc.date.issued	2006
dc.identifier.citation	Jiang, S.P. and Zhen, Y. and Zhang, S. and Tok, A.I.Y. and Wu, P. 2006. An Electrochemical Method to Assess the Chromium Volatility of Chromia-Forming Metallic Interconnect for SOFCs. Journal of the Electrochemical Society. 153 (11): pp. A2120-A2125.
dc.identifier.uri	http://hdl.handle.net/20.500.11937/4679
dc.identifier.doi	10.1149/1.2345585
dc.publisher	The Electrochemical Society, Inc
dc.title	An Electrochemical Method to Assess the Chromium Volatility of Chromia-Forming Metallic Interconnect for SOFCs
dc.type	Journal Article
dcterms.source.volume	153
dcterms.source.number	11
dcterms.source.startPage	A2120
dcterms.source.endPage	A2125
dcterms.source.issn	0013-4651
dcterms.source.title	Journal of the Electrochemical Society
curtin.accessStatus	Fulltext not available