Aberration corrections for non-Bragg-Brentano diffraction geometries
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The construction of peak intensity, profile and displacement aberration functions based on the geometry of a powder diffraction measurement allows for physically realistic corrections to be applied in Rietveld modelling through a fundamental parameters approach. Parallel-beam corrections for asymmetric reflection and Debye-Scherrer geometry are summarized, and corrections for thin-plate transmission are derived and validated. Geometrically correct implementations of preferred orientation models are also summarized.
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