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    Contact line motion on nanorough surfaces: A thermally activated process

    Access Status
    Fulltext not available
    Authors
    Ramiasa, M.
    Ralston, J.
    Fetzer, R.
    Sedev, Rossen
    Fopp-Spori, D.
    Morhard, C.
    Pacholski, C.
    Spatz, J.
    Date
    2013
    Type
    Journal Article
    
    Metadata
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    Citation
    Ramiasa, M. and Ralston, J. and Fetzer, R. and Sedev, R. and Fopp-Spori, D. and Morhard, C. and Pacholski, C. et al. 2013. Contact line motion on nanorough surfaces: A thermally activated process. Journal of the American Chemical Society. 135 (19): pp. 7159-7171.
    Source Title
    Journal of the American Chemical Society
    DOI
    10.1021/ja3104846
    ISSN
    0002-7863
    School
    Department of Chemical Engineering
    URI
    http://hdl.handle.net/20.500.11937/53820
    Collection
    • Curtin Research Publications
    Abstract

    The motion of a solid-liquid-liquid contact line over nanorough surfaces is investigated. The surface nanodefects are varied in size, density, and shape. The dynamics of the three-phase contact line on all nanorough substrates studied is thermally activated. However, unlike the motion of a liquid-vapor interface over smooth surfaces, this thermally activated process is not adequately described by the molecular kinetic theory. The molecular parameters extracted from the experiments suggest that on the nanorough surfaces, the motion of the contact line is unlikely to simply consist of molecular adsorption-desorption steps. Thermally activated pinning-depinning events on the surface nanodefects are also important. We investigate the effect of surface nanotopography on the relative importance of these two mechanisms in governing contact line motion. Using a derivation for the hysteresis energy based on Joanny and de Gennes's model, we evaluate the effect of nanotopographical features on the wetting activation free energy and contact line friction. Our results suggest that both solid-liquid interactions and surface pinning strength contribute to the energy barriers hindering the three-phase contact line motion. For relatively low nanodefect densities, the activation free energy of wetting can be expressed as a sum of surface wettability and surface topography contributions, thus providing a direct link between contact line dynamics and roughness parameters.

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