Show simple item record

dc.contributor.authorKhawsithiwong, P.
dc.contributor.authorYatawara, Nihal
dc.date.accessioned2017-01-30T10:46:37Z
dc.date.available2017-01-30T10:46:37Z
dc.date.created2014-10-08T06:00:48Z
dc.date.issued2007
dc.identifier.citationKhawsithiwong, P. and Yatawara, N. 2007. Monitoring Process Variability with Individual Measurements Following Elliptically Contoured Distributions. Communications in Statistics - Simulation and Computation. 36: pp. 699-718.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/5507
dc.publisherTaylor and Francis
dc.titleMonitoring Process Variability with Individual Measurements Following Elliptically Contoured Distributions
dc.typeJournal Article
dcterms.source.volume36
dcterms.source.startPage699
dcterms.source.endPage718
dcterms.source.issn03610918
dcterms.source.titleCommunications in Statistics - Simulation and Computation
curtin.departmentDepartment of Mathematics and Statistics
curtin.accessStatusFulltext not available


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record