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dc.contributor.authorVogel, Y.
dc.contributor.authorZhang, L.
dc.contributor.authorDarwish, N.
dc.contributor.authorGoncales, V.
dc.contributor.authorLe Brun, A.
dc.contributor.authorGooding, J.
dc.contributor.authorMolina, A.
dc.contributor.authorWallace, G.
dc.contributor.authorCoote, M.
dc.contributor.authorGonzalez, J.
dc.contributor.authorCiampi, Simone
dc.date.accessioned2018-02-06T06:17:36Z
dc.date.available2018-02-06T06:17:36Z
dc.date.created2018-02-06T05:50:01Z
dc.date.issued2017
dc.identifier.citationVogel, Y. and Zhang, L. and Darwish, N. and Goncales, V. and Le Brun, A. and Gooding, J. and Molina, A. et al. 2017. Reproducible flaws unveil electrostatic aspects of semiconductor electrochemistry. Nature Communications. -.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/63478
dc.identifier.doi10.1038/s41467-017-02091-1
dc.publisherMacmillan Publishers Limited
dc.relation.sponsoredbyhttp://purl.org/au-research/grants/arc/DE160100732
dc.relation.sponsoredbyhttp://purl.org/au-research/grants/arc/DE160101101
dc.titleReproducible flaws unveil electrostatic aspects of semiconductor electrochemistry
dc.typeJournal Article
dcterms.source.volume-
dcterms.source.issn2041-1723
dcterms.source.titleNature Communications
curtin.departmentNanochemistry Research Institute
curtin.accessStatusOpen access via publisher


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