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dc.contributor.authorWang, H.
dc.contributor.authorDavari, P.
dc.contributor.authorWang, H.
dc.contributor.authorKumar, D.
dc.contributor.authorZare, Firuz
dc.contributor.authorBlaabjerg, F.
dc.date.accessioned2018-06-29T12:26:18Z
dc.date.available2018-06-29T12:26:18Z
dc.date.created2018-06-29T12:08:54Z
dc.date.issued2018
dc.identifier.citationWang, H. and Davari, P. and Wang, H. and Kumar, D. and Zare, F. and Blaabjerg, F. 2018. Lifetime benchmarking of two DC-link passive filtering configurations in adjustable speed drives, pp. 228-233.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/68590
dc.identifier.doi10.1109/APEC.2018.8341014
dc.description.abstract

© 2018 IEEE. Electrolytic capacitors with a DC-side inductor, and the slim DC-link capacitor are two typical filtering configurations in Adjustable Speed Drives (ASDs). The reliability performance of these capacitive DC-link solutions is an essential aspect to be considered, which depends on both component inherent capability and the operational conditions (e.g., electro-thermal stresses) in the field operation. This paper studies the reliability performance of the LC filter and slim capacitor based filter in a standard ASD system. Considering the variations of the capacitor parameters, environment stresses, and lifetime model, the lifetime of the two configurations are compared. Moreover, scalability analysis is presented in terms of power rating, amplitude and phase angle unbalance levels at the grid side. The results serve as a guideline for reliability aspect performance benchmarking of different DC-link solutions in ASD applications.

dc.titleLifetime benchmarking of two DC-link passive filtering configurations in adjustable speed drives
dc.typeConference Paper
dcterms.source.volume2018-March
dcterms.source.startPage228
dcterms.source.endPage233
dcterms.source.titleConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
dcterms.source.seriesConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
dcterms.source.isbn9781538611807
curtin.departmentSchool of Electrical Engineering, Computing and Mathematical Science (EECMS)
curtin.accessStatusFulltext not available


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