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dc.contributor.authorCarter, Geoffrey
dc.contributor.authorGolovanevskiy, Vladimir
dc.contributor.editorSTEF92 Technology Ltd
dc.date.accessioned2017-01-30T11:02:19Z
dc.date.available2017-01-30T11:02:19Z
dc.date.created2011-03-03T20:01:29Z
dc.date.issued2010
dc.identifier.citationCarter, Geoffrey A. and Golovanevskiy, Vladimir A. 2010. Development and Testing of Down-the-Hole Deployabe X-Ray Florescence Spectrometer, 10th International Multidisciplinary Scientific Geoconference - SGEM 2010, Jun 20 2010, pp. 407-413. Sofia, Bulgaria: STEF92 Technology Ltd.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/7756
dc.identifier.doi10.5593/sgem2010.1.3.S1.816
dc.description.abstract

To allow a truly in-situ elemental analysis, an Australian resource company commissioned the development and building of a down-the-hole deployable ED-XRF sensor. The instrument was designed to be deployable up to a depth of 30 m for drill holes of varying diameters as well as being run in a bench-top mode. Following the development and upon commissioning, the ED-XRF system was investigated in the laboratory for its suitability for use in the Iron Ore industry by using well characterised crushed iron ore samples, standards made from analytical reagents and large iron ore rocks that had been sectioned to provide a curved surface for presentation to the XRF. The effects of operating conditions and other parameters were studied using the standards made from the analytical reagents. It was found that the system could be used to determine the elemental Fe content with reasonable accuracy when used on crushed powder samples. The curved surfaces of the sectioned rocks increased the variability of the amount of Fe detected. Two trace elements, Al and Si were also investigated using the same methodology. It was found that the ED-XRF system was not suitable for distinguishing the Al and Si. This paper outlines the ED-XRF system used, the testing methodology employed and the results of the laboratory testing.

dc.publisherSGEM 2010
dc.subjectDown-The-Hole
dc.subjectX-Ray Fluorescence Spectroscopy
dc.subjectField deployable
dc.titleDevelopment and Testing of Down-the-Hole Deployabe X-Ray Florescence Spectrometer
dc.typeConference Paper
dcterms.source.startPage407
dcterms.source.endPage413
dcterms.source.titleConference Proceedings, Volume 1
dcterms.source.seriesConference Proceedings, Volume 1
dcterms.source.isbn954918181-2
dcterms.source.conference10th International Multidisciplinary Scientific Geoconference SGEM 2010
dcterms.source.conference-start-dateJun 20 2010
dcterms.source.conferencelocationSofia, Bulgaria
dcterms.source.placeSofia, Bulgaria
curtin.note

Carter, Geoffrey A. and Golovanevskiy, Vladimir A. 2010. Development and Testing of Down-the-Hole Deployabe X-Ray Florescence Spectrometer, 10th International Multidisciplinary Scientific Geoconference - SGEM 2010, Jun 20 2010, pp. 407-413. Sofia, Bulgaria: STEF92 Technology Ltd. DOI: 10.5593/sgem2010.1.3.S1.816

curtin.note

The official site of the International Multidisciplinary Scientific GeoConference (SGEM) can be found at: http://www.sgem.org

curtin.departmentRio Tinto Centre for Materials and Sensing in Mining (RTCMSM)
curtin.accessStatusOpen access


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