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dc.contributor.authorReddy, Steven
dc.contributor.authorSaxey, David
dc.contributor.authorRickard, William
dc.contributor.authorFougerouse, Denis
dc.contributor.authorMontalvo, S.D.
dc.contributor.authorVerberne, R.
dc.contributor.authorVan Riessen, Arie
dc.date.accessioned2020-05-21T03:21:19Z
dc.date.available2020-05-21T03:21:19Z
dc.date.issued2020
dc.identifier.citationReddy, S.M. and Saxey, D.W. and Rickard, W.D.A. and Fougerouse, D. and Montalvo, S.D. and Verberne, R. and van Riessen, A. 2020. Atom Probe Tomography: Development and Application to the Geosciences. Geostandards and Geoanalytical Research. 44 (1): pp. 5-50.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/79359
dc.identifier.doi10.1111/ggr.12313
dc.description.abstract

Atom probe tomography (APT) is an analytical technique that provides quantitative three-dimensional elemental and isotopic analyses at sub-nanometre resolution across the whole periodic table. Although developed and mostly used in the materials science and semiconductor fields, recent years have seen increasing development and application in the geoscience and planetary science disciplines. Atom probe studies demonstrate compositional complexity at the nanoscale and provide fundamental new insights into the atom-scale mechanisms taking place in minerals over geological time. Here, we provide an overview of APT, including the historical development and technical aspects of the instrumentation, and the fundamentals of data acquisition, data processing and data reconstruction. We also review previous studies and highlight the potential future applications of nanoscale geochemical studies of natural materials.

dc.languageEnglish
dc.publisherWILEY
dc.relation.sponsoredbyhttp://purl.org/au-research/grants/arc/DE190101307
dc.subjectScience & Technology
dc.subjectPhysical Sciences
dc.subjectGeochemistry & Geophysics
dc.subjectatom probe
dc.subjectmicroscopy
dc.subjectmineral
dc.subjectgeochemistry
dc.subjectisotope geochemistry
dc.subjectnanoscale
dc.subjectFIELD-ION MICROSCOPY
dc.subjectTRANSMISSION ELECTRON-MICROSCOPY
dc.subjectTIME-OF-FLIGHT
dc.subjectSPECIMEN PREPARATION
dc.subjectGRAIN-BOUNDARIES
dc.subjectLOCAL MAGNIFICATION
dc.subjectQUANTITATIVE-ANALYSIS
dc.subjectKIKUCHI DIFFRACTION
dc.subjectSPATIAL-RESOLUTION
dc.subjectPHASE BOUNDARIES
dc.titleAtom Probe Tomography: Development and Application to the Geosciences
dc.typeJournal Article
dcterms.source.volume44
dcterms.source.number1
dcterms.source.startPage5
dcterms.source.endPage50
dcterms.source.issn1639-4488
dcterms.source.titleGeostandards and Geoanalytical Research
dc.date.updated2020-05-21T03:21:12Z
curtin.departmentSchool of Earth and Planetary Sciences (EPS)
curtin.departmentJohn de Laeter Centre (JdLC)
curtin.accessStatusOpen access via publisher
curtin.facultyFaculty of Science and Engineering
curtin.contributor.orcidSaxey, David [0000-0001-7433-946X]
curtin.contributor.orcidReddy, Steven [0000-0002-4726-5714]
curtin.contributor.orcidRickard, William [0000-0002-8118-730X]
curtin.contributor.researcheridSaxey, David [H-5782-2014]
curtin.contributor.researcheridReddy, Steven [A-9149-2008]
curtin.contributor.researcheridRickard, William [E-9963-2013]
curtin.contributor.researcheridVan Riessen, Arie [C-9519-2009]
dcterms.source.eissn1751-908X
curtin.contributor.scopusauthoridSaxey, David [15059256300]
curtin.contributor.scopusauthoridReddy, Steven [7402263354]
curtin.contributor.scopusauthoridRickard, William [35171231700]
curtin.contributor.scopusauthoridFougerouse, Denis [56418452200]
curtin.contributor.scopusauthoridVan Riessen, Arie [6602942836]


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