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dc.contributor.authorZhang, Jinyang
dc.contributor.authorFerrie, Stuart
dc.contributor.authorZhang, Song
dc.contributor.authorVogel, Yan
dc.contributor.authorPeiris, Chandramalika
dc.contributor.authorDarwish, Nadim
dc.contributor.authorCiampi, Simone
dc.date.accessioned2020-05-31T00:08:09Z
dc.date.available2020-05-31T00:08:09Z
dc.date.issued2019
dc.identifier.citationZhang, J. and Ferrie, S. and Zhang, S. and Vogel, Y.B. and Peiris, C.R. and Darwish, N. and Ciampi, S. 2019. Single-Electrode Electrochemistry: Chemically Engineering Surface Adhesion and Hardness to Maximize Redox Work Extracted from Tribocharged Silicon. ACS Applied Nano Materials. 2 (11): pp. 7230-7236.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/79495
dc.identifier.doi10.1021/acsanm.9b01726
dc.description.abstract

© 2019 American Chemical Society.

Recent research has demonstrated that heterogeneous charge-transfer reactions are not restricted to conductors and that electrochemical reactions can occur on the surface of statically charged insulators. However, the exact mechanism by which insulators gain and lose electrical charges remains controversial. Herein we have studied quantitatively the reduction of silver ions on intrinsic amorphous silicon surfaces that are statically charged by contact against plastic polymers. We have quantified the magnitude of the redox work done by the tribocharged silicon surface as a function of its adhesion and hardness, with these two variables being tuned using covalent Si - C monolayer chemistries. We observed that metallic particles grow preferentially over surfaces that are relatively soft (low DMT modulus) and highly adhesive, hence indirectly proving that the triboelectrification of an insulator-insulator dynamic contact is caused by the exchange of ionic fragments, rather than by the movement of free electrons. This work clarifies the origin of triboelectricity, devises a surface-chemistry method to maximize tribocharging with immediate scope in single-electrode electrochemistry, and describes a concept potentially suitable for the mask-free and bias-free patterning of metal nanoparticles on photoconductors.

dc.languageEnglish
dc.publisherAMER CHEMICAL SOC
dc.relation.sponsoredbyhttp://purl.org/au-research/grants/arc/DE160100732
dc.relation.sponsoredbyhttp://purl.org/au-research/grants/arc/DE160101101
dc.relation.sponsoredbyhttp://purl.org/au-research/grants/arc/DP190100735
dc.subjectScience & Technology
dc.subjectTechnology
dc.subjectNanoscience & Nanotechnology
dc.subjectMaterials Science, Multidisciplinary
dc.subjectScience & Technology - Other Topics
dc.subjectMaterials Science
dc.subjectsingle electrode electrochemistry
dc.subjecttribocharging
dc.subjectcontact electrification
dc.subjectsurface adhesion and hardness
dc.subjectamorphous silicon
dc.subjectsurface chemistry
dc.subjectCONTACT
dc.subjectCHARGE
dc.subjectFRICTION
dc.subjectMONOLAYERS
dc.subjectCHEMISTRY
dc.subjectREVERSAL
dc.titleSingle-Electrode Electrochemistry: Chemically Engineering Surface Adhesion and Hardness to Maximize Redox Work Extracted from Tribocharged Silicon
dc.typeJournal Article
dcterms.source.volume2
dcterms.source.number11
dcterms.source.startPage7230
dcterms.source.endPage7236
dcterms.source.issn2574-0970
dcterms.source.titleACS Applied Nano Materials
dc.date.updated2020-05-31T00:08:08Z
curtin.departmentSchool of Molecular and Life Sciences (MLS)
curtin.accessStatusOpen access
curtin.facultyFaculty of Science and Engineering
curtin.contributor.orcidDarwish, Nadim [0000-0002-6565-1723]
curtin.contributor.orcidCiampi, Simone [0000-0002-8272-8454]
curtin.contributor.orcidVogel, Yan [0000-0003-1975-7292]
curtin.contributor.researcheridCiampi, Simone [D-9129-2014]
dcterms.source.eissn2574-0970
curtin.contributor.scopusauthoridDarwish, Nadim [14031207900]
curtin.contributor.scopusauthoridCiampi, Simone [21733701500]


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