Numerical characterization of AFM images of self-structured surface textures

Abstract

Results obtained showed that, for the isotropic surfaces, the ABRG method is not considerably affected (i.e. <5%) by image resolution, tip size (for surfaces with large motifs) and noise levels lower than 9%. On the other hand, for anisotropic surfaces, the effects were much stronger (i.e. -34%). This indicates that ABRG method can be effective in the analysis of AFM images of self-structured surface textures. However, precautions should be taken when analyzing AFM images of surface textures with small motifs and/or anisotropy. The results also showed that the ABRG method is able to quantify changes in surface roughness occurring during the formation of photoinduced textures. Thus, the method has a potential to become a valuable tool in analyzing formation process of self-structured surfaces.