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dc.contributor.authorIronside, Charlie
dc.contributor.authorRickard, William
dc.contributor.authorDekker-Zangari, C.
dc.contributor.authorGray, C.
dc.contributor.authorMcGlynn, E.
dc.contributor.authorMarks, Nigel
dc.date.accessioned2020-12-10T07:33:01Z
dc.date.available2020-12-10T07:33:01Z
dc.date.issued2019
dc.identifier.citationIronside, C.N. and Rickard, W.D.A. and Dekker-Zangari, C. and Gray, C. and McGlynn, E. and Marks, N.A. 2019. Hot probe measurements on neutron irradiated, isotope enriched ZnO nanorods. AIP Advances. 9 (3): Article No. 035223.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/82060
dc.identifier.doi10.1063/1.5061722
dc.description.abstract

© 2019 Author(s). We report on neutron transmutation doping (NTD) of isotopically (64Zn) enriched ZnO nanorods to produce material with holes as the majority mobile carrier. Nanorods of ZnO enriched with 64Zn were synthesised and the abundance of 64Zn in these samples is ∼ 71%, compared to the natural abundance of ∼ 49 %. The enriched material was irradiated with thermal neutrons which converts some 64Zn to 65Zn. The 65Zn decays to 65Cu with a half-life of 244 days and the Cu can act as an acceptor dopant. After 690 days, a hot probe technique was used to determine the majority charge carriers in non-irradiated and neutron irradiated nanorod samples. Non-irradiated samples were measured to be to have electrons as the majority mobile carrier and the irradiated samples were measured to have holes as the majority mobile carrier.

dc.languageEnglish
dc.publisherAMER INST PHYSICS
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.subjectScience & Technology
dc.subjectTechnology
dc.subjectPhysical Sciences
dc.subjectNanoscience & Nanotechnology
dc.subjectMaterials Science, Multidisciplinary
dc.subjectPhysics, Applied
dc.subjectScience & Technology - Other Topics
dc.subjectMaterials Science
dc.subjectPhysics
dc.subjectFILMS
dc.titleHot probe measurements on neutron irradiated, isotope enriched ZnO nanorods
dc.typeJournal Article
dcterms.source.volume9
dcterms.source.number3
dcterms.source.issn2158-3226
dcterms.source.titleAIP Advances
dc.date.updated2020-12-10T07:33:01Z
curtin.departmentSchool of Electrical Engineering, Computing and Mathematical Sciences (EECMS)
curtin.departmentJohn de Laeter Centre (JdLC)
curtin.accessStatusOpen access
curtin.facultyFaculty of Science and Engineering
curtin.contributor.orcidRickard, William [0000-0002-8118-730X]
curtin.contributor.orcidMarks, Nigel [0000-0003-2372-1284]
curtin.contributor.researcheridRickard, William [E-9963-2013]
curtin.identifier.article-numberARTN 035223
dcterms.source.eissn2158-3226
curtin.contributor.scopusauthoridRickard, William [35171231700]
curtin.contributor.scopusauthoridIronside, Charlie [7007084337]
curtin.contributor.scopusauthoridMarks, Nigel [7101779863]


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