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dc.contributor.authorZhao, M.H.
dc.contributor.authorUmair, M.
dc.contributor.authorLu, Chunsheng
dc.contributor.authorQin, G.S.
dc.date.accessioned2021-01-24T09:46:12Z
dc.date.available2021-01-24T09:46:12Z
dc.date.issued2021
dc.identifier.citationZhao, M.H. and Umair, M. and Lu, C. and Qin, G.S. 2021. Electric current-restrained crack propagation in brittle GaN ceramics. Journal of Materials Science. 56 (9): pp. 5730-5735.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/82381
dc.identifier.doi10.1007/s10853-020-05692-2
dc.description.abstract

© 2021, The Author(s), under exclusive licence to Springer Science+Business Media, LLC part of Springer Nature. The reliability of a ceramic structure or device is closely related to its faults, such as structural defects and cracks. Here, we show that cracking in piezoelectric semi-conductive ceramics (PSCs) can be restrained with the application of an electric current. Due to the crack-generated flexoelectricity, piezoelectric polarization charges that generate and gather on the front of a crack result in a strong thermoelectric effect. The phase transition and plastic deformation happened near a crack tip can hinder the propagation of the crack and even lead to its partial closure. These new findings are instructive to study the crack control and the design of PSC devices with damage tolerance.

dc.languageEnglish
dc.publisherSPRINGER
dc.subjectScience & Technology
dc.subjectTechnology
dc.subjectMaterials Science, Multidisciplinary
dc.subjectMaterials Science
dc.subjectFRACTURE-TOUGHNESS
dc.subjectCONDUCTIVE CRACKS
dc.subjectFIELD
dc.subjectBEHAVIOR
dc.subjectFAILURE
dc.titleElectric current-restrained crack propagation in brittle GaN ceramics
dc.typeJournal Article
dcterms.source.volume56
dcterms.source.number9
dcterms.source.startPage5730
dcterms.source.endPage5735
dcterms.source.issn0022-2461
dcterms.source.titleJournal of Materials Science
dc.date.updated2021-01-24T09:46:11Z
curtin.departmentSchool of Civil and Mechanical Engineering
curtin.accessStatusFulltext not available
curtin.facultyFaculty of Science and Engineering
curtin.contributor.orcidLu, Chunsheng [0000-0002-7368-8104]
dcterms.source.eissn1573-4803
curtin.contributor.scopusauthoridLu, Chunsheng [57061177000]


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