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dc.contributor.authorSutinjo, Adrian
dc.contributor.authorBelostotski, L.
dc.contributor.authorJuswardy, Budi
dc.contributor.authorUng, Daniel X.C.
dc.date.accessioned2021-06-29T02:39:57Z
dc.date.available2021-06-29T02:39:57Z
dc.date.issued2020
dc.identifier.citationSutinjo, A.T. and Belostotski, L. and Juswardy, B. and Ung, D.X.C. 2020. A Measure of Well-Spread Points in Noise Wave-Based Source Matrix for Wideband Noise Parameter Measurement: The SKA-Low Example. IEEE Transactions on Microwave Theory and Techniques. 68 (5): pp. 1783-1793.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/84207
dc.identifier.doi10.1109/TMTT.2020.2977287
dc.description.abstract

The existence of a figure of merit for measuring the degree of well-spread source points in noise parameter extraction has long been conjectured. This article proposes a measure based on noise waves that is physically motivated and is directly connected to linear algebra through the matrix condition number and/or determinant. The key to this figure of merit is the selection of the noise temperature equation and the removal of singularity due to the 1/(1-|\Gamma _{s}|^{2}) factor. The result is a well-scaled source matrix with entries bounded within a unit circle. We demonstrate the effectiveness of this measure by extracting the noise parameters of an amplifier in the low-frequency Square Kilometre Array (SKA-Low) band of 50-350 MHz using seven tuner positions. The noise parameters in the 50-100-MHz band are successfully measured despite being below the 100-MHz tuner rating. This outcome is very well predicted by the condition number and the determinant of the source matrix in question.

dc.languageEnglish
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.subjectScience & Technology
dc.subjectTechnology
dc.subjectEngineering, Electrical & Electronic
dc.subjectEngineering
dc.subjectLow-noise amplifiers (LNAs)
dc.subjectnoise measurements
dc.subjectradio astronomy
dc.subjectthermal noise
dc.subjectultra high frequency (UHF) circuits
dc.subjectvery high frequency (VHF) circuits
dc.subjectIMPEDANCE-PATTERN
dc.subjectDEVICE NOISE
dc.titleA Measure of Well-Spread Points in Noise Wave-Based Source Matrix for Wideband Noise Parameter Measurement: The SKA-Low Example
dc.typeJournal Article
dcterms.source.volume68
dcterms.source.number5
dcterms.source.startPage1783
dcterms.source.endPage1793
dcterms.source.issn0018-9480
dcterms.source.titleIEEE Transactions on Microwave Theory and Techniques
dc.date.updated2021-06-29T02:39:34Z
curtin.note

© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

curtin.departmentSchool of Electrical Engineering, Computing and Mathematical Sciences (EECMS)
curtin.accessStatusOpen access
curtin.facultyFaculty of Science and Engineering
curtin.contributor.orcidSutinjo, Adrian [0000-0002-9116-307X]
curtin.contributor.orcidJuswardy, Budi [0000-0002-4931-0494]
curtin.contributor.orcidUng, Daniel [0000-0002-7775-9635]
curtin.contributor.orcidUng, Daniel X.C. [0000-0002-7775-9635]
curtin.contributor.researcheridSutinjo, Adrian [B-5569-2013]
curtin.contributor.researcheridJuswardy, Budi [B-8316-2013]
dcterms.source.eissn1557-9670
curtin.contributor.scopusauthoridSutinjo, Adrian [11840375100]
curtin.contributor.scopusauthoridJuswardy, Budi [24528084300]


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