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dc.contributor.authorQiao, Y.
dc.contributor.authorZhao, M.
dc.contributor.authorQin, G.
dc.contributor.authorLu, Chunsheng
dc.contributor.authorFan, C.
dc.date.accessioned2023-02-08T12:11:49Z
dc.date.available2023-02-08T12:11:49Z
dc.date.issued2023
dc.identifier.citationQiao, Y. and Zhao, M. and Qin, G. and Lu, C. and Fan, C. 2023. The influence of temperature on the electrical conductivity of GaN piezoelectric semiconductors. AIP Advances. 13 (1): 015105.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/90389
dc.identifier.doi10.1063/5.0133129
dc.description.abstract

GaN is an excellent material choice for power devices due to its excellent properties such as super wide bandgap width and high electron mobility. However, the problem of temperature affects the thermo reliability and hinders the potential of GaN devices. In this paper, the electrical properties of GaN under temperature have been studied by the combination of numerical simulation and experimental research. The electric current change and electrical resistivity of polarized and depolarized GaN semiconductor samples were tested in an environment-test cabinet. Based on the influence of temperature, the expression of the resistivity curve vs temperature was established for polarized and depolarized GaN samples. It is shown that the resistivity model predictions are consistent with experimental results. The I-V characteristic curves under different temperatures were also measured. Thus, such a model is instructive to the reliable design of GaN high-temperature devices. The findings will be instructive to the optimal design of GaN electronic components.

dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.titleThe influence of temperature on the electrical conductivity of GaN piezoelectric semiconductors
dc.typeJournal Article
dcterms.source.volume13
dcterms.source.number1
dcterms.source.titleAIP Advances
dc.date.updated2023-02-08T12:11:47Z
curtin.departmentSchool of Civil and Mechanical Engineering
curtin.accessStatusOpen access
curtin.facultyFaculty of Science and Engineering
curtin.contributor.orcidLu, Chunsheng [0000-0002-7368-8104]
curtin.identifier.article-number015105
dcterms.source.eissn2158-3226
curtin.contributor.scopusauthoridLu, Chunsheng [57061177000]


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