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    Charge injection across self-assembly monolayers in organic field-effect transistors: Odd-even effects

    Access Status
    Fulltext not available
    Authors
    Stoliar, P.
    Kshirsagar, R.
    Massi, Massimiliano
    Annibale, P.
    Albonetti, C.
    de Leeuw, D.
    Biscarini, F.
    Date
    2007
    Type
    Journal Article
    
    Metadata
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    Citation
    Stoliar, Pablo and Kshirsagar, Rajendra and Massi, Massimiliano and Annibale, Paolo and Albonetti, Cristiano and de Leeuw, Dago M. and Biscarini, Fabio. 2007. Charge injection across self-assembly monolayers in organic field-effect transistors: Odd-even effects. Journal of the American Chemical Society 129 (20): pp. 6477-6484.
    Source Title
    Journal of the American Chemical Society
    DOI
    10.1021/ja069235m
    ISSN
    00027863
    URI
    http://hdl.handle.net/20.500.11937/11926
    Collection
    • Curtin Research Publications
    Abstract

    We investigate the role of self-assembly monolayers in modulating the response of organic field-effect transistors. Alkanethiol monolayers of chain length n are self-assembled on the source and drain electrodes of pentacene field-effect transistors. The charge carrier mobility mu exhibits large fluctuations correlated with odd-even n. For n < 8, mu increases by 1 order of magnitude owing to the decrease of the hole injection barrier and the improved molecular order at the organic-metallic interface. For n >= 8, mu decays exponentially with an inverse decay length beta = 0.6 A(-1). Our results show that (i) charge injection across the interface occurs by through-bond tunneling of holes mediated by the alkanethiol layer; (ii) in the long-chain regime, the charge injection across the alkanethiol monolayer completely governs the transistor response; (iii) the transistor is a sensitive gauge for probing charge transport across single monolayers. The odd-even effect is ascribed to the anisotropic coupling between the alkanethiol terminal sigma bond and the HOMO level of ordered pentacene molecules.

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