Measurement of Space Charge Distributions in PLZT using Kerr Effect
| dc.contributor.author | Wong, Kiing-Ing | |
| dc.date.accessioned | 2017-01-30T11:58:32Z | |
| dc.date.available | 2017-01-30T11:58:32Z | |
| dc.date.created | 2013-02-14T20:00:27Z | |
| dc.date.issued | 2012 | |
| dc.identifier.citation | Wong, Kiing Ing. 2012. Measurement of Space Charge Distributions in PLZT using Kerr Effect. IEEJ Transactions on Electrical and Electronic Engineering. 7 (5): pp. 454-457. | |
| dc.identifier.uri | http://hdl.handle.net/20.500.11937/16918 | |
| dc.identifier.doi | 10.1002/tee.21757 | |
| dc.description.abstract |
Kerr effect technique is an optical measurement technique used to determine space charge distributions of a dielectric liquid under applied electric stress. In other words, such measurement can be used to study the conduction mechanisms of a dielectric liquid, such as charge injection threshold, bulk electric field stress, and aging. In this study, an instrument was set up to measure the absolute value of the electric field distributions in lead–lanthanum–zirconium–titanium (PLZT). PLZT was selected for the study of the instrumentation because the material has a high Kerr constant. In the experiment, charge injection threshold and bulk field strength of PLZT were measured under low applied voltages. | |
| dc.publisher | Wiley Online Library | |
| dc.subject | Kerr effect | |
| dc.subject | dielectric liquid | |
| dc.subject | space charge | |
| dc.title | Measurement of Space Charge Distributions in PLZT using Kerr Effect | |
| dc.type | Journal Article | |
| dcterms.source.volume | 7 | |
| dcterms.source.number | 5 | |
| dcterms.source.startPage | 454 | |
| dcterms.source.endPage | 457 | |
| dcterms.source.issn | 19314981 | |
| dcterms.source.title | IEEJ Transactions on Electrical and Electronic Engineering | |
| curtin.department | ||
| curtin.accessStatus | Fulltext not available |