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    Real-time acoustic emission testing based on wavelet transform for the failure process of thermal barrier coatings

    Access Status
    Fulltext not available
    Authors
    Yang, L.
    Zhou, Y.C.
    Mao, W.
    Lu, Chungsheng
    Date
    2008
    Type
    Journal Article
    
    Metadata
    Show full item record
    Citation
    Yang, Li and Zhou, Yi-Chun and Mao, Weiguo and Lu, Chungsheng. 2008. Real-time acoustic emission testing based on wavelet transform for the failure process of thermal barrier coatings. Applied Physics Letters. 93 (23): pp. 231906-1-231906-3.
    Source Title
    Applied Physics Letters
    DOI
    10.1063/1.3043458
    ISSN
    00036951
    Faculty
    Faculty of Science and Engineering
    Department of Mechanical Engineering
    School of Civil and Mechanical Engineering
    Remarks

    Copyright © 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

    This article appeared in Appl. Phys. Lett. Volume 93, Issue 23, published 10 December 2008 and may be found at: http://link.aip.org/link/?APPLAB/93/231906/1

    URI
    http://hdl.handle.net/20.500.11937/26318
    Collection
    • Curtin Research Publications
    Abstract

    The fracture type differentiation, quantification, and source identification are desirable and yet intractable in the acoustic emission (AE) testing of a complex coating system. In this letter, a technique combining wavelet transform and conventional AE parameter analysis was developed to study the tensile failure process of thermal barrier coatings in real time. It is demonstrated that the failure of thermal barrier coatings originates from surface vertical cracking and follows interface cracking, and that the AE count increases with tensile load following a power law. The cracking source identified from AE signals agrees well with that observed by optical microscopy. This technique provides a powerful tool for the study of failure processes of a wide range of coatings and thin films.

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