Real-time acoustic emission testing based on wavelet transform for the failure process of thermal barrier coatings
dc.contributor.author | Yang, L. | |
dc.contributor.author | Zhou, Y.C. | |
dc.contributor.author | Mao, W. | |
dc.contributor.author | Lu, Chungsheng | |
dc.date.accessioned | 2017-01-30T12:52:48Z | |
dc.date.available | 2017-01-30T12:52:48Z | |
dc.date.created | 2009-05-14T02:17:17Z | |
dc.date.issued | 2008 | |
dc.identifier.citation | Yang, Li and Zhou, Yi-Chun and Mao, Weiguo and Lu, Chungsheng. 2008. Real-time acoustic emission testing based on wavelet transform for the failure process of thermal barrier coatings. Applied Physics Letters. 93 (23): pp. 231906-1-231906-3. | |
dc.identifier.uri | http://hdl.handle.net/20.500.11937/26318 | |
dc.identifier.doi | 10.1063/1.3043458 | |
dc.description.abstract |
The fracture type differentiation, quantification, and source identification are desirable and yet intractable in the acoustic emission (AE) testing of a complex coating system. In this letter, a technique combining wavelet transform and conventional AE parameter analysis was developed to study the tensile failure process of thermal barrier coatings in real time. It is demonstrated that the failure of thermal barrier coatings originates from surface vertical cracking and follows interface cracking, and that the AE count increases with tensile load following a power law. The cracking source identified from AE signals agrees well with that observed by optical microscopy. This technique provides a powerful tool for the study of failure processes of a wide range of coatings and thin films. | |
dc.publisher | American Institute of Physics | |
dc.title | Real-time acoustic emission testing based on wavelet transform for the failure process of thermal barrier coatings | |
dc.type | Journal Article | |
dcterms.source.volume | 93 | |
dcterms.source.number | 23 | |
dcterms.source.startPage | 231906 | |
dcterms.source.endPage | 1 | |
dcterms.source.issn | 00036951 | |
dcterms.source.title | Applied Physics Letters | |
curtin.note |
Copyright © 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. | |
curtin.note |
This article appeared in Appl. Phys. Lett. Volume 93, Issue 23, published 10 December 2008 and may be found at: | |
curtin.accessStatus | Fulltext not available | |
curtin.faculty | Faculty of Science and Engineering | |
curtin.faculty | Department of Mechanical Engineering | |
curtin.faculty | School of Civil and Mechanical Engineering |