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Atom probe tomography studies of gan-based semiconductor materials

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Open access via publisher
Authors
Bennett, S.
Oliver, R.
Saxey, David
Cerezo, A.
Clifton, P.
Ulfig, R.
Kappers, M.
Humphreys, C.
Date
2009
Type
Journal Article

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Citation
Bennett, S. and Oliver, R. and Saxey, D. and Cerezo, A. and Clifton, P. and Ulfig, R. and Kappers, M. et al. 2009. Atom probe tomography studies of gan-based semiconductor materials. Microscopy and Microanalysis. 15 (SUPPL. 2): pp. 280-281.
Source Title
Microscopy and Microanalysis
DOI
ISSN
School
John de Laeter CoE in Mass Spectrometry
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