Atom probe tomography studies of gan-based semiconductor materials
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Bennett, S. and Oliver, R. and Saxey, D. and Cerezo, A. and Clifton, P. and Ulfig, R. and Kappers, M. et al. 2009. Atom probe tomography studies of gan-based semiconductor materials. Microscopy and Microanalysis. 15 (SUPPL. 2): pp. 280-281.
Microscopy and Microanalysis
John de Laeter CoE in Mass Spectrometry