Determination of trace metals by underpotential deposition–stripping voltammetry at solid electrodes

Abstract

We introduce the behaviour and applications of underpotential deposition (UPD) and its combination with stripping voltammetry (UPD–SV) of metal analytes at solid-electrode surfaces as an important analytical strategy for trace-metal determinations. We review the principles of UPD together with model metal/electrode systems, and discuss analytical utility, including achievement of limits of detection (LODs) and applications to a variety of sample matrices. We present an approach to the alleviation of sample-matrix effects by using surface-protective disorganised monolayer coatings. Finally, we also present the outlook for UPD-SV as an electroanalytical tool.