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    Optimal metric selection for improved multi-pose face recognition with group information

    189221_189221.pdf (160.1Kb)
    Access Status
    Open access
    Authors
    Zhang, X.
    Pham, DucSon
    Liu, W.
    Venkatesh, S.
    Date
    2012
    Type
    Conference Paper
    
    Metadata
    Show full item record
    Citation
    Zhang, Xin and Pham, Duc-Son and Liu, Wanquan and Venkatesh, Svetha. 2012. Optimal metric selection for improved multi-pose face recognition with group information, in Proceedings of the 2012 21st International Conference on Pattern Recognition, Nov 11-15 2012, pp. 1675-1678. Tsukuba, Japan: Science Council of Japan.
    Source Title
    Proceedings of the 2012 International Conference on Pattern Recognition
    Source Conference
    International Conference on Pattern Recognition
    Additional URLs
    http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6460470
    ISBN
    9784990644109
    ISSN
    1051-4651
    Remarks

    © 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

    NOTICE: This is the author’s version of a work in which changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication.

    URI
    http://hdl.handle.net/20.500.11937/46687
    Collection
    • Curtin Research Publications
    Abstract

    We address the limitation of sparse representation based classification with group information for multi-pose face recognition. First, we observe that the key issue of such classification problem lies in the choice of the metric norm of the residual vectors, which represent the fitness of each class. Then we point out that limitation of the current sparse representation classification algorithms is the wrong choice of the ℓ2 norm, which does not match with data statistics as these residual values may be considerably non-Gaussian. We propose an explicit but effective solution using ℓp norm and explain theoretically and numerically why such metric norm would be able to suppress outliers and thus can significantly improve classification performance comparable to the state-of-arts algorithms on some challenging datasets.

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