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dc.contributor.authorZhang, X.
dc.contributor.authorPham, DucSon
dc.contributor.authorLiu, W.
dc.contributor.authorVenkatesh, S.
dc.contributor.editorN/A
dc.date.accessioned2017-01-30T15:28:41Z
dc.date.available2017-01-30T15:28:41Z
dc.date.created2013-02-18T20:00:44Z
dc.date.issued2012
dc.identifier.citationZhang, Xin and Pham, Duc-Son and Liu, Wanquan and Venkatesh, Svetha. 2012. Optimal metric selection for improved multi-pose face recognition with group information, in Proceedings of the 2012 21st International Conference on Pattern Recognition, Nov 11-15 2012, pp. 1675-1678. Tsukuba, Japan: Science Council of Japan.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/46687
dc.description.abstract

We address the limitation of sparse representation based classification with group information for multi-pose face recognition. First, we observe that the key issue of such classification problem lies in the choice of the metric norm of the residual vectors, which represent the fitness of each class. Then we point out that limitation of the current sparse representation classification algorithms is the wrong choice of the ℓ2 norm, which does not match with data statistics as these residual values may be considerably non-Gaussian. We propose an explicit but effective solution using ℓp norm and explain theoretically and numerically why such metric norm would be able to suppress outliers and thus can significantly improve classification performance comparable to the state-of-arts algorithms on some challenging datasets.

dc.publisherICPR
dc.relation.urihttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6460470
dc.subjectvectors
dc.subjecttraining
dc.subjectface
dc.subjectface recognition
dc.subjectlighting
dc.subjectrobustness
dc.subjectmeasurement
dc.titleOptimal metric selection for improved multi-pose face recognition with group information
dc.typeConference Paper
dcterms.source.issn1051-4651
dcterms.source.titleProceedings of the 2012 International Conference on Pattern Recognition
dcterms.source.seriesProceedings of the 2012 International Conference on Pattern Recognition
dcterms.source.isbn9784990644109
dcterms.source.conferenceInternational Conference on Pattern Recognition
dcterms.source.conference-start-dateNov 11 2012
dcterms.source.conferencelocationTsukuba Science City, Japan
dcterms.source.placeUSA
curtin.note

© 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

curtin.note

NOTICE: This is the author’s version of a work in which changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication.

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curtin.accessStatusOpen access


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