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Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction

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Open access
Authors
Chen, Q.
Mao, W.
Zhou, Y.
Lu, Chungsheng
Date
2010
Type
Journal Article

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Citation
Chen, Q. and Mao, W.G. and Zhou, Y.C. and Lu, C. 2010. Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction. Applied Surface Science. 256 (23): pp. 7311-7315.
Source Title
Applied Surface Science
DOI
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Faculty
School of Engineering
Faculty of Science and Engineering
Department of Mechanical Engineering
Remarks

The link to the journal’s home page is: http://www.elsevier.com/wps/find/journaldescription.cws_home/505669/description#description. Copyright © 2010 Elsevier B.V. All rights reserved

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