Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction
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Open access
Authors
Chen, Q.
Mao, W.
Zhou, Y.
Lu, Chungsheng
Date
2010Type
Journal Article
Metadata
Show full item recordCitation
Chen, Q. and Mao, W.G. and Zhou, Y.C. and Lu, C. 2010. Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction. Applied Surface Science. 256 (23): pp. 7311-7315.
Source Title
Applied Surface Science
Faculty
School of Engineering
Faculty of Science and Engineering
Department of Mechanical Engineering
Remarks
The link to the journal’s home page is: http://www.elsevier.com/wps/find/journaldescription.cws_home/505669/description#description. Copyright © 2010 Elsevier B.V. All rights reserved