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    Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction

    147957_147957.pdf (590.8Kb)
    Access Status
    Open access
    Authors
    Chen, Q.
    Mao, W.
    Zhou, Y.
    Lu, Chungsheng
    Date
    2010
    Type
    Journal Article
    
    Metadata
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    Citation
    Chen, Q. and Mao, W.G. and Zhou, Y.C. and Lu, C. 2010. Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction. Applied Surface Science. 256 (23): pp. 7311-7315.
    Source Title
    Applied Surface Science
    DOI
    10.1016/j.apsusc.2010.05.071
    ISSN
    01694332
    Faculty
    School of Engineering
    Faculty of Science and Engineering
    Department of Mechanical Engineering
    Remarks

    The link to the journal’s home page is: http://www.elsevier.com/wps/find/journaldescription.cws_home/505669/description#description. Copyright © 2010 Elsevier B.V. All rights reserved

    URI
    http://hdl.handle.net/20.500.11937/48014
    Collection
    • Curtin Research Publications

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