Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction
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Chen, Q. and Mao, W.G. and Zhou, Y.C. and Lu, C. 2010. Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction. Applied Surface Science. 256 (23): pp. 7311-7315.
Applied Surface Science
School of Engineering
Faculty of Science and Engineering
Department of Mechanical Engineering
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