Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction
| dc.contributor.author | Chen, Q. | |
| dc.contributor.author | Mao, W. | |
| dc.contributor.author | Zhou, Y. | |
| dc.contributor.author | Lu, Chungsheng | |
| dc.date.accessioned | 2017-01-30T15:36:56Z | |
| dc.date.available | 2017-01-30T15:36:56Z | |
| dc.date.created | 2010-10-28T20:02:54Z | |
| dc.date.issued | 2010 | |
| dc.identifier.citation | Chen, Q. and Mao, W.G. and Zhou, Y.C. and Lu, C. 2010. Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction. Applied Surface Science. 256 (23): pp. 7311-7315. | |
| dc.identifier.uri | http://hdl.handle.net/20.500.11937/48014 | |
| dc.identifier.doi | 10.1016/j.apsusc.2010.05.071 | |
| dc.publisher | Elsevier BV North-Holland | |
| dc.title | Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction | |
| dc.type | Journal Article | |
| dcterms.source.volume | 256 | |
| dcterms.source.number | 23 | |
| dcterms.source.startPage | 7311 | |
| dcterms.source.endPage | 7315 | |
| dcterms.source.issn | 01694332 | |
| dcterms.source.title | Applied Surface Science | |
| curtin.note |
The link to the journal’s home page is: | |
| curtin.accessStatus | Open access | |
| curtin.faculty | School of Engineering | |
| curtin.faculty | Faculty of Science and Engineering | |
| curtin.faculty | Department of Mechanical Engineering |