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dc.contributor.authorVo, Ba Tuong
dc.contributor.authorTran, N.
dc.contributor.authorPhung, D.
dc.contributor.authorVo, Ba-Ngu
dc.date.accessioned2017-08-24T02:22:44Z
dc.date.available2017-08-24T02:22:44Z
dc.date.created2017-08-23T07:21:43Z
dc.date.issued2017
dc.identifier.citationVo, B.T. and Tran, N. and Phung, D. and Vo, B. 2017. Model-based classification and novelty detection for point pattern data, pp. 2622-2627.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/56163
dc.identifier.doi10.1109/ICPR.2016.7900030
dc.description.abstract

© 2016 IEEE. Point patterns are sets or multi-sets of unordered elements that can be found in numerous data sources. However, in data analysis tasks such as classification and novelty detection, appropriate statistical models for point pattern data have not received much attention. This paper proposes the modelling of point pattern data via random finite sets (RFS). In particular, we propose appropriate likelihood functions, and a maximum likelihood estimator for learning a tractable family of RFS models. In novelty detection, we propose novel ranking functions based on RFS models, which substantially improve performance.

dc.titleModel-based classification and novelty detection for point pattern data
dc.typeConference Paper
dcterms.source.startPage2622
dcterms.source.endPage2627
dcterms.source.titleProceedings - International Conference on Pattern Recognition
dcterms.source.seriesProceedings - International Conference on Pattern Recognition
dcterms.source.isbn9781509048472
curtin.departmentDepartment of Electrical and Computer Engineering
curtin.accessStatusFulltext not available


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