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    Transition from dislocation controlled plasticity to grain boundary mediated shear in nanolayered aluminum/palladium thin films

    Access Status
    Fulltext not available
    Authors
    Dayal, P.
    Quadir, Md Zakaria
    Kong, C.
    Savvides, N.
    Hoffman, M.
    Date
    2011
    Type
    Journal Article
    
    Metadata
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    Citation
    Dayal, P. and Quadir, M.Z. and Kong, C. and Savvides, N. and Hoffman, M. 2011. Transition from dislocation controlled plasticity to grain boundary mediated shear in nanolayered aluminum/palladium thin films. Thin Solid Films. 519 (10): pp. 3213-3220.
    Source Title
    Thin Solid Films
    DOI
    10.1016/j.tsf.2010.12.112
    ISSN
    0040-6090
    School
    John de Laeter Centre
    URI
    http://hdl.handle.net/20.500.11937/62863
    Collection
    • Curtin Research Publications
    Abstract

    Nanolayered materials consisting of alternate layers of two different metals offer enhanced mechanical properties such as hardness but the strengthening mechanism is not well understood when the bilayer thickness approaches a few nanometers. Here, we report on the uniaxial compression of aluminum/palladium pillars (900 nm diameter) with bilayer thickness = 2, 20 and 80 nm. We observe that the deformation behavior of these pillars depends on the value of bilayer thickness, changing from dislocation driven plasticity at large bilayer thickness to shear due to grain rotation via grain boundary sliding at small bilayer thickness. The transition occurs at about a bilayer thickness of 20 nm where a mixture of the two mechanisms is apparent. © 2010 Elsevier B.V. All rights Reserved.

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