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dc.contributor.authorVogel, Yan
dc.contributor.authorMolina, A.
dc.contributor.authorGonzalez, J.
dc.contributor.authorCiampi, Simone
dc.date.accessioned2020-05-31T00:10:23Z
dc.date.available2020-05-31T00:10:23Z
dc.date.issued2019
dc.identifier.citationVogel, Y.B. and Molina, A. and Gonzalez, J. and Ciampi, S. 2019. Quantitative Analysis of Cyclic Voltammetry of Redox Monolayers Adsorbed on Semiconductors: Isolating Electrode Kinetics, Lateral Interactions, and Diode Currents. Analytical Chemistry. 91 (9): pp. 5929-5937.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/79496
dc.identifier.doi10.1021/acs.analchem.9b00336
dc.description.abstract

© 2019 American Chemical Society.

The design of devices whose functions span from sensing their environments to converting light into electricity or guiding chemical reactivity at surfaces often hinges around a correct and complete understanding of the factors at play when charges are transferred across an electrified solid-liquid interface. For semiconductor electrodes in particular, published values for charge-transfer kinetic constants are scattered. Furthermore, received wisdom suggests slower charge-transfer kinetics for semiconductors than for metal electrodes. We have used cyclic voltammetry of ferrocene-modified silicon photoanodes and photocathodes as the experimental model system and described a systematic analysis to separate charge-transfer kinetics from diode effects and interactions between adsorbed species. Our results suggest that literature values of charge-transfer kinetic constants at semiconductor electrodes are likely to be underestimates of their actual values. This is revealed by experiments and analytical models showing that the description of the potential distribution across the semiconductor-monolayer-electrolyte interface has been largely oversimplified.

dc.languageEnglish
dc.publisherAMER CHEMICAL SOC
dc.relation.sponsoredbyhttp://purl.org/au-research/grants/arc/DP190100735
dc.subjectScience & Technology
dc.subjectPhysical Sciences
dc.subjectChemistry, Analytical
dc.subjectChemistry
dc.subjectSILICON
dc.subjectSURFACE
dc.subjectCHARGE
dc.titleQuantitative Analysis of Cyclic Voltammetry of Redox Monolayers Adsorbed on Semiconductors: Isolating Electrode Kinetics, Lateral Interactions, and Diode Currents
dc.typeJournal Article
dcterms.source.volume91
dcterms.source.number9
dcterms.source.startPage5929
dcterms.source.endPage5937
dcterms.source.issn0003-2700
dcterms.source.titleAnalytical Chemistry
dc.date.updated2020-05-31T00:10:22Z
curtin.note

This document is the Accepted Manuscript version of a Published Work that appeared in final form in Analytical Chemistry, copyright © American Chemical Society, after peer review and technical editing by the publisher. To access the final edited and published work see https://doi.org/10.1021/acs.analchem.9b00336.

curtin.departmentSchool of Molecular and Life Sciences (MLS)
curtin.accessStatusOpen access
curtin.facultyFaculty of Science and Engineering
curtin.contributor.orcidCiampi, Simone [0000-0002-8272-8454]
curtin.contributor.orcidVogel, Yan [0000-0003-1975-7292]
curtin.contributor.researcheridCiampi, Simone [D-9129-2014]
dcterms.source.eissn1520-6882
curtin.contributor.scopusauthoridCiampi, Simone [21733701500]


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