A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM)
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Barr, M. and O'Donnell, K. and Fahy, A. and Allison, W. and Dastoor, P. 2012. A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM). Measurement Science and Technology. 23 (10): Article ID 105901.
Measurement Science and Technology
Department of Imaging and Applied Physics
A simple design for an inexpensive, compact, desktop-sized helium free-jet beam source is described. The apparatus, which is Campargue-like in design and utilizes mostly off-the-shelf parts, is capable of producing a centreline intensity of 1.2 × 10^19 atoms per second per steradian. The beam performance was investigated using a conventional ion gauge and a stagnation detector, with the latter being used to produce beam flux profiles. The profile of the macroskimmed beam has been experimentally demonstrated to be strongly Gaussian.
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