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dc.contributor.authorBarr, M.
dc.contributor.authorO'Donnell, Kane
dc.contributor.authorFahy, A.
dc.contributor.authorAllison, W.
dc.contributor.authorDastoor, P.
dc.identifier.citationBarr, M. and O'Donnell, K. and Fahy, A. and Allison, W. and Dastoor, P. 2012. A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM). Measurement Science and Technology. 23 (10): Article ID 105901.

A simple design for an inexpensive, compact, desktop-sized helium free-jet beam source is described. The apparatus, which is Campargue-like in design and utilizes mostly off-the-shelf parts, is capable of producing a centreline intensity of 1.2 × 10^19 atoms per second per steradian. The beam performance was investigated using a conventional ion gauge and a stagnation detector, with the latter being used to produce beam flux profiles. The profile of the macroskimmed beam has been experimentally demonstrated to be strongly Gaussian.

dc.publisherIOP Publishing Ltd
dc.subjecthelium atom microscopy
dc.subjecthelium beam source
dc.subjecthelium atom scattering
dc.titleA desktop supersonic free-jet beam source for a scanning helium microscope (SHeM)
dc.typeJournal Article
dcterms.source.titleMeasurement Science and Technology
curtin.departmentDepartment of Imaging and Applied Physics
curtin.accessStatusFulltext not available

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