A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM)
| dc.contributor.author | Barr, M. | |
| dc.contributor.author | O'Donnell, Kane | |
| dc.contributor.author | Fahy, A. | |
| dc.contributor.author | Allison, W. | |
| dc.contributor.author | Dastoor, P. | |
| dc.date.accessioned | 2017-01-30T11:03:46Z | |
| dc.date.available | 2017-01-30T11:03:46Z | |
| dc.date.created | 2014-09-08T20:00:17Z | |
| dc.date.issued | 2012 | |
| dc.identifier.citation | Barr, M. and O'Donnell, K. and Fahy, A. and Allison, W. and Dastoor, P. 2012. A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM). Measurement Science and Technology. 23 (10): Article ID 105901. | |
| dc.identifier.uri | http://hdl.handle.net/20.500.11937/7979 | |
| dc.identifier.doi | 10.1088/0957-0233/23/10/105901 | |
| dc.description.abstract |
A simple design for an inexpensive, compact, desktop-sized helium free-jet beam source is described. The apparatus, which is Campargue-like in design and utilizes mostly off-the-shelf parts, is capable of producing a centreline intensity of 1.2 × 10^19 atoms per second per steradian. The beam performance was investigated using a conventional ion gauge and a stagnation detector, with the latter being used to produce beam flux profiles. The profile of the macroskimmed beam has been experimentally demonstrated to be strongly Gaussian. | |
| dc.publisher | IOP Publishing Ltd | |
| dc.subject | Campargue | |
| dc.subject | SHeM | |
| dc.subject | helium atom microscopy | |
| dc.subject | helium beam source | |
| dc.subject | helium atom scattering | |
| dc.title | A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM) | |
| dc.type | Journal Article | |
| dcterms.source.volume | 23 | |
| dcterms.source.number | 10 | |
| dcterms.source.issn | 0957-0233 | |
| dcterms.source.title | Measurement Science and Technology | |
| curtin.department | Department of Imaging and Applied Physics | |
| curtin.accessStatus | Fulltext not available |