Released micromachined beams utilizing laterally uniform porosity porous silicon
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This is an article published in Nanoscale Research Letters, available online at: http://doi.org/10.1186/1556-276X-9-426.
© 2014, Sun et al.; licensee Springer.
Abstract: Suspended micromachined porous silicon beams with laterally uniform porosity are reported, which have been fabricated using standard photolithography processes designed for compatibility with complementary metal-oxide-semiconductor (CMOS) processes. Anodization, annealing, reactive ion etching, repeated photolithography, lift off and electropolishing processes were used to release patterned porous silicon microbeams on a Si substrate. This is the first time that micromachined, suspended PS microbeams have been demonstrated with laterally uniform porosity, well-defined anchors and flat surfaces.
PACS: 81.16.-c; 81.16.Nd; 81.16.Rf