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    Released micromachined beams utilizing laterally uniform porosity porous silicon

    1556-276X-9-426.pdf (1.721Mb)
    Access Status
    Open access
    Authors
    Sun, Xiao
    Keating, Adrian
    Parish, Giacinta
    Date
    2014
    Type
    Journal Article
    
    Metadata
    Show full item record
    Citation
    Sun, X. and Keating, A. and Parish, G. 2014. Released micromachined beams utilizing laterally uniform porosity porous silicon. Nanoscale Research Letters. 9. Article No. 426.
    Source Title
    Nanoscale Research Letters
    DOI
    10.1186/1556-276X-9-426
    ISSN
    1931-7573
    Faculty
    Faculty of Science and Engineering
    School
    John de Laeter Centre (JdLC)
    Remarks

    This is an article published in Nanoscale Research Letters, available online at: http://doi.org/10.1186/1556-276X-9-426.

    URI
    http://hdl.handle.net/20.500.11937/79814
    Collection
    • Curtin Research Publications
    Abstract

    © 2014, Sun et al.; licensee Springer.

    Abstract: Suspended micromachined porous silicon beams with laterally uniform porosity are reported, which have been fabricated using standard photolithography processes designed for compatibility with complementary metal-oxide-semiconductor (CMOS) processes. Anodization, annealing, reactive ion etching, repeated photolithography, lift off and electropolishing processes were used to release patterned porous silicon microbeams on a Si substrate. This is the first time that micromachined, suspended PS microbeams have been demonstrated with laterally uniform porosity, well-defined anchors and flat surfaces.

    PACS: 81.16.-c; 81.16.Nd; 81.16.Rf

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